A universal top-down approach toward thickness-controllable perovskite single-crystalline thin films

2018 ◽  
Vol 6 (16) ◽  
pp. 4464-4470 ◽  
Author(s):  
Qianrui Lv ◽  
Zhipeng Lian ◽  
Wenhui He ◽  
Jia-Lin Sun ◽  
Qiang Li ◽  
...  
Keyword(s):  
Thin Films ◽  
Single Crystal ◽  
Bulk Single Crystal ◽  
Top Down ◽  
Single Crystalline ◽  
Crystalline Film ◽  
Hybrid Perovskite ◽  
Single Crystalline Film

A facile and general top-down strategy to fabricate hybrid perovskite single-crystalline film from its bulk single crystal is developed.

Reactive Solid-Phase Epitaxy: ∼ A novel growth method for single-crystalline thin films of complex oxides with superlattice structure ∼

2002 ◽  
Vol 747 ◽  
Author(s):  
H. Ohta ◽  
K. Nomura ◽  
H. Hiramatsu ◽  
T. Suzuki ◽  
K. Ueda ◽  
...  
Keyword(s):  
Thin Films ◽  
Solid Phase ◽  
Solid Phase Epitaxy ◽  
Single Crystalline ◽  
Crystalline Film ◽  
Superlattice Structure ◽  
Growth Method ◽  
Natural Superlattice ◽  
Single Crystalline Film ◽  
Spe Method

ABSTRACTWe have developed a novel growth method for single-crystalline film of natural superlattice oxides and named the method “Reactive Solid-Phase Epitaxy (R-SPE).” Single-crystalline thin films of homologous series In-GaO3(ZnO)m (m=integer) are fabricated by the R-SPE method and its growth mechanism, especially a role of ZnO epitaxial layer, is clarified. High-temperature annealing of bi-layer films consisting of an amorphous InGaO3(ZnO)5 layer deposited at room temperature and an epitaxial ZnO layer on YSZ substrate allows for the growth of single-crystalline film with a controlled chemical composition. The ZnO layer plays an essential role in determining the crystallographic orientation, while the thickness ratio between the two layers controls the film composition.

Surface microscopy with scanned electron beams

1986 ◽  
Vol 318 (1541) ◽  
pp. 243-257 ◽  
Keyword(s):  
Thin Films ◽  
Single Crystal ◽  
Recent Work ◽  
Electron Spectroscopy ◽  
Secondary Electron ◽  
Electron Beams ◽  
Bulk Single Crystal ◽  
Future Developments ◽  
Surface Microscopy

A brief review is given of the methods that are available for studying surfaces on a microscope scale. The use of finely focused scanned electron beams is described in detail. Examples are given of Auger and secondary electron spectroscopy and microscopy, and of diffraction techniques. These examples are largely taken from recent work of the authors on Ag layers on bulk single-crystal Si (111), Si (100) and W (110) surfaces, but applications to other materials and to thin films are also discussed. Future developments are briefly outlined.

In silico Raman spectroscopy of YAlO3 single-crystalline film

2020 ◽  
Vol 231 ◽  
pp. 118111
Author(s):  
Wioletta Dewo ◽  
Katarzyna Łuczyńska ◽  
Yuriy Zorenko ◽  
Vitaliy Gorbenko ◽  
Kacper Drużbicki ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
In Silico ◽  
Single Crystalline ◽  
Crystalline Film ◽  
Single Crystalline Film

Epitaxial growth of single-crystalline-film scintillators based on Tb3+-doped and Tb3+–Ce3+-codoped Gd1–xLuxAlO3 (x = 0–1) mixed perovskites

CrystEngComm ◽  
2019 ◽  
Vol 21 (9) ◽  
pp. 1433-1441 ◽  
Author(s):  
V. Gorbenko ◽  
T. Zorenko ◽  
K. Paprocki ◽  
F. Riva ◽  
P. A. Douissard ◽  
...  
Keyword(s):  
Liquid Phase ◽  
Epitaxial Growth ◽  
Liquid Phase Epitaxy ◽  
Single Crystalline ◽  
Crystalline Film ◽  
Crystalline Films ◽  
Single Crystalline Film

The paper is dedicated to the development of scintillating screens based on the single crystalline films of singly Tb3+ and doubly Tb3+–Ce3+ doped Gd1–xLuxAlO3 (x = 0–1) perovskites grown onto YAlO3 substrates using the liquid phase epitaxy method.

Growth of high-quality C60(111) single crystalline film on Ni3Co(111) surface

1997 ◽  
Vol 282-287 ◽  
pp. 739-740 ◽  
Author(s):  
Zeng Jianlin ◽  
Wang Yan ◽  
Li Yongqing ◽  
J.G. Hou
Keyword(s):  
High Quality ◽  
Single Crystalline ◽  
Crystalline Film ◽  
Single Crystalline Film
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