Seeds screening aqueous synthesis, multiphase interfacial separation and in situ optical characterization of invisible ultrathin silver nanowires

Nanoscale ◽  
2018 ◽  
Vol 10 (33) ◽  
pp. 15468-15484 ◽  
Author(s):  
Xiao-Yang Zhang ◽  
Xiao-Mei Xue ◽  
Huan-Li Zhou ◽  
Ning Zhao ◽  
Feng Shan ◽  
...  
Keyword(s):  
Optical Characteristic ◽  
Silver Nanowires ◽  
Optical Characterization ◽  
Visible Range ◽  
Aqueous Synthesis ◽  
Interfacial Separation

Synthesis and in situ optical characteristic investigation of ultrathin silver nanowires with ∼100% transparency in the whole visible range.

In situ optical characterization of LaAlO 3 epitaxy on SrTiO 3 (001)

2015 ◽  
Vol 109 (3) ◽  
pp. 37006 ◽  
Author(s):  
X. D. Zhu ◽  
Sebastian Wicklein ◽  
Felix Gunkel ◽  
Rui Xiao ◽  
Regina Dittmann
Keyword(s):  
Optical Characterization

Optical Characterization of Graphene Oxide Films by Spectroscopic Ellipsometry

2016 ◽  
Vol 851 ◽  
pp. 199-204 ◽  
Author(s):  
Veronika Schmiedova ◽  
Jan Pospisil ◽  
Oldrich Zmeskal ◽  
Viliam Vretenar
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Graphene Oxide ◽  
Spectroscopic Ellipsometry ◽  
Inkjet Printing ◽  
Optical Characterization ◽  
Thermal Reduction ◽  
Visible Range ◽  
Dispersion Function

The paper deals with the study of optical properties of graphene oxide (GO) by inkjet printing. Defined structure of GO can be obtained by reducing of prepared layers either by heating or by UV radiation (rGO). The dispersion function for refractive index and extinction coefficient of GO and both rGO thin films were measured by spectroscopic ellipsometry in the wavelength range of 200 – 850 nm. Spectroscopic ellipsometry (SE) was used characterize the optical response of layer of GO reduced by UV and thermal reduction GO in visible range.

scholarly journals In situ and ex situ optical characterization of electro deposited magneto-optic materials

1996 ◽  
Vol 79 (8) ◽  
pp. 6193 ◽  
Author(s):  
James N. Hilfiker ◽  
Darin W. Glenn ◽  
Scott Heckens ◽  
John A. Woollam ◽  
Kurt W. Wierman
Keyword(s):  
Optical Characterization ◽  
Ex Situ ◽  
Magneto Optic

In situ optical characterization of GaAs and InP surfaces during chloride atomic layer epitaxy

1993 ◽  
Vol 225 (1-2) ◽  
pp. 47-52 ◽  
Author(s):  
Kenichi Nishi ◽  
Akira Usui ◽  
Hiroyuki Sakaki
Keyword(s):  
Atomic Layer ◽  
Optical Characterization ◽  
Atomic Layer Epitaxy

Refractive Index Modification During Deposition of Silicon Oxynitride Films Prepared by Reactive Laser Ablation

1998 ◽  
Vol 526 ◽  
Author(s):  
R. Machorro ◽  
G. Soto ◽  
E. C. Samano ◽  
L. Cota-Araiza
Keyword(s):  
Refractive Index ◽  
Laser Ablation ◽  
Optical Filters ◽  
Optical Characterization ◽  
Silicon Oxynitride ◽  
Xps Characterization ◽  
High Oxidation ◽  
Oxygen Gas

AbstractInhomogeneous low-k thin films of SiOxNy have been deposited by laser ablation of a Si3N4 sintered target in presence of oxygen gas. The high oxidation rate of silicon nitride has been used to control the stoichiometry of the films by modifying the oxygen partial pressure. The refractive index of the deposited material was able to be tailored at any value between 1.47 (SiO2) to 2.03 (Si3N4) by this approach. In situ optical characterization of the growing films was possible using kinetic and spectro ellipsometry. The refractive index was determined by applying the Effective Medium Approximation (EMA) and considering a mixture of SiO2, Si3N4, and voids. The volumetric composition obtained by ellipsometry was compared to the results determined by AES and XPS characterization. The purpose of this application is to show that reactive PLD can be used to produce high quality optical filters.

Optical Characterization of Commercial Lithiated Graphite Battery Electrodes and in Situ Fiber Optic Evanescent Wave Spectroscopy

2016 ◽  
Vol 8 (29) ◽  
pp. 18763-18769 ◽  
Author(s):  
AbdulRahman Ghannoum ◽  
Ryan C. Norris ◽  
Krishna Iyer ◽  
Liliana Zdravkova ◽  
Aiping Yu ◽  
...  
Keyword(s):  
Evanescent Wave ◽  
Fiber Optic ◽  
Optical Characterization
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