Overwhelming coexistence of negative differential resistance effect and RRAM
2018 ◽
Vol 20
(31)
◽
pp. 20635-20640
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Keyword(s):
An overwhelming coexistence of NDR effect and RS memory behavior at room temperature was observed based on Ag/CZTSe/Mo devices.
Keyword(s):
Keyword(s):
2002 ◽
Vol 12
(10)
◽
pp. 2927-2930
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