Evolution of lateral V-defects on InGaN/GaN on Si(111) during PAMBE: the role of strain on defect kinetics
In this article, a unique correlation has been established between the defect kinetics of III-nitride adatoms and strain during plasma assisted molecular beam epitaxial (PAMBE) growth of InGaN/GaN heterostructures on silicon(111) for the first time.
1971 ◽
Vol 134
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pp. 395-416
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1988 ◽
Vol 86
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pp. 354-361
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1988 ◽
Vol 6
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pp. 2834-2839
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1970 ◽
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1986 ◽
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pp. 590
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2011 ◽
Vol 323
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pp. 68-71
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