An efficient and thickness insensitive cathode interface material for high performance inverted perovskite solar cells with 17.27% efficiency

2017 ◽  
Vol 5 (24) ◽  
pp. 5949-5955 ◽  
Author(s):  
Sen Peng ◽  
Jingsheng Miao ◽  
Imran Murtaza ◽  
Liang Zhao ◽  
Zhao Hu ◽  
...  

A thickness insensitive water/alcohol soluble small molecular, PN6, exhibits high electron mobility with deep LUMO energy level, and effectively decrease the work function of the cathode. Those properties significantly enhance the power conversion efficiency from 8.73% (control cell) to 17.27%.

2020 ◽  
Vol 829 ◽  
pp. 154542 ◽  
Author(s):  
Bing Ren ◽  
Meiyong Liao ◽  
Masatomo Sumiya ◽  
Jian Li ◽  
Lei Wang ◽  
...  

VLSI Design ◽  
2009 ◽  
Vol 2009 ◽  
pp. 1-9 ◽  
Author(s):  
Mohammad Javad Sharifi ◽  
Davoud Bahrepour

A new structure for an exclusive-OR (XOR) gate based on the resonant-tunneling high electron mobility transistor (RTHEMT) is introduced which comprises only an RTHEMT and two FETs. Calculations are done by utilizing a new subcircuit model for simulating the RTHEMT in the SPICE simulator. Details of the design, input, and output values and margins, delay of each transition, maximum operating frequency, static and dynamic power dissipations of the new structure are discussed and calculated and the performance is compared with other XOR gates which confirm that the presented structure has a high performance. Furthermore, to the best of authors' knowledge, it has the least component count in comparison to the existing structures.


2018 ◽  
Vol 762 ◽  
pp. 933-940 ◽  
Author(s):  
Xinglai Zhang ◽  
Yanan Jiang ◽  
Baodan Liu ◽  
Wenjin Yang ◽  
Jing Li ◽  
...  

1998 ◽  
Vol 535 ◽  
Author(s):  
T. Feng ◽  
A. Dimoulas ◽  
N. Strifas ◽  
A. Christou

AbstractAlGaAs/GaAs based high electron mobility transistors (HEMTs) with Cu/Ti metallized gates have been fabricated. Copper gates were used to achieve low gate resistance and to minimize the hydrogen induced device degradation. The DC measurement of the processed AlGaAs/GaAs HEMTs with Cu/Ti gates shows comparable performance to similar Au based GaAs HEMTs. The Cu-based HEMTs were also subjected to elevated temperature testing under 5% H2 –N2 forming gas up to 250°C and 8 hours and no degradation due to hydrogen effects was found.


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