Functionalization of any substrate using covalently modified large area CVD graphene

2017 ◽  
Vol 53 (67) ◽  
pp. 9308-9311 ◽  
Author(s):  
Felix Rösicke ◽  
Marc A. Gluba ◽  
Timur Shaykhutdinov ◽  
Guoguang Sun ◽  
Christoph Kratz ◽  
...  

The transfer of p-(N-maleimido)phenyl functionalized graphene has been shown to be robust and lossless.

2014 ◽  
Vol 16 (8) ◽  
pp. 3632 ◽  
Author(s):  
G. V. Bianco ◽  
M. Losurdo ◽  
M. M. Giangregorio ◽  
P. Capezzuto ◽  
G. Bruno
Keyword(s):  

Carbon ◽  
2014 ◽  
Vol 77 ◽  
pp. 814-822 ◽  
Author(s):  
Bian Wu ◽  
Hatice M. Tuncer ◽  
Anestis Katsounaros ◽  
Weiping Wu ◽  
Matthew T. Cole ◽  
...  

2015 ◽  
Vol 6 (14) ◽  
pp. 2745-2750 ◽  
Author(s):  
Felix Lang ◽  
Marc A. Gluba ◽  
Steve Albrecht ◽  
Jörg Rappich ◽  
Lars Korte ◽  
...  

2020 ◽  
Vol 31 (24) ◽  
pp. 21821-21831
Author(s):  
Chaitanya Arya ◽  
K. Kanishka H. De Silva ◽  
Masamichi Yoshimura

2016 ◽  
Vol 6 (1) ◽  
Author(s):  
S. Goniszewski ◽  
M. Adabi ◽  
O. Shaforost ◽  
S. M. Hanham ◽  
L. Hao ◽  
...  

Abstract Correlations between the level of p-doping exhibited in large area chemical vapour deposition (CVD) graphene field effect transistor structures (gFETs) and residual charges created by a variety of surface treatments to the silicon dioxide (SiO2) substrates prior to CVD graphene transfer are measured. Beginning with graphene on untreated thermal oxidised silicon, a minimum conductivity (σ min ) occurring at gate voltage V g  = 15 V (Dirac Point) is measured. It was found that more aggressive treatments (O2 plasma and UV Ozone treatments) further increase the gate voltage of the Dirac point up to 65 V, corresponding to a significant increase of the level of p-doping displayed in the graphene. An electrowetting model describing the measured relationship between the contact angle (θ) of a water droplet applied to the treated substrate/graphene surface and an effective gate voltage from a surface charge density is proposed to describe biasing of V g at σ min and was found to fit the measurements with multiplication of a correction factor, allowing effective non-destructive approximation of substrate added charge carrier density using contact angle measurements.


2015 ◽  
Vol 5 (1) ◽  
Author(s):  
Thomas H. Bointon ◽  
Gareth F. Jones ◽  
Adolfo De Sanctis ◽  
Ruth Hill-Pearce ◽  
Monica F. Craciun ◽  
...  

2014 ◽  
Vol 14 ◽  
pp. S119-S122 ◽  
Author(s):  
K. Takehana ◽  
Y. Imanaka ◽  
T. Takamasu ◽  
Y. Kim ◽  
K.-S. An

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