EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon

Effect of independently sized gates on the delay of reconfigurable silicon nanowire transistor based circuits

EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon ◽

10.1109/ulis.2015.7063762 ◽

2015 ◽

Cited By ~ 2

Author(s):

Jens Trommer ◽

Stefan Slesazeck ◽

Walter M. Weber ◽

Andre Heinzig ◽

Tim Baldauf ◽

...

Keyword(s):

Silicon Nanowire ◽

Nanowire Transistor

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Quasi-static capacitance measurements in pseudo-MOSFET configuration for Dit extraction in SOI wafers

EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon ◽

10.1109/ulis.2015.7063820 ◽

2015 ◽

Author(s):

L. Pirro ◽

I. Ionica ◽

X. Mescot ◽

S. Cristoloveanu ◽

G. Ghibaudo ◽

...

Keyword(s):

Capacitance Measurements ◽

Static Capacitance

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Ultra-low-power diodes using junctionless nanowire transistors

EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon ◽

10.1109/ulis.2015.7063836 ◽

2015 ◽

Author(s):

M. de Souza ◽

R. T. Doria ◽

R. D. Trevisoli ◽

M. A. Pavanello

Keyword(s):

Low Power ◽

Ultra Low Power ◽

Nanowire Transistors ◽

Power Diodes

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A simple analytical Variable Barrier Transistor drain current model

EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon ◽

10.1109/ulis.2015.7063826 ◽

2015 ◽

Author(s):

Oana Moldovan ◽

Francois Lime ◽

Benjamin Iniguez ◽

Sylvain Barraud

Keyword(s):

Current Model ◽

Drain Current ◽

Analytical Variable

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Comparison between vertical silicon NW-TFET and NW-MOSFETfrom analog point of view

EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon ◽

10.1109/ulis.2015.7063816 ◽

2015 ◽

Cited By ~ 1

Author(s):

P. G. D. Agopian ◽

J. A. Martino ◽

A. Vandooren ◽

R. Rooyackers ◽

E. Simoen ◽

...

Keyword(s):

Point Of View

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Analytical approach to consider Gaussian junction profiles in compact models of tunnel-FETs

EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon ◽

10.1109/ulis.2015.7063751 ◽

2015 ◽

Cited By ~ 3

Author(s):

Michael Graef ◽

Franziska Hain ◽

Fabian Hosenfeld ◽

Benjamin Iniguez ◽

Alexander Kloes

Keyword(s):

Analytical Approach ◽

Compact Models ◽

Tunnel Fets

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Toward understanding of donor-traps-related dispersion phenomena on normally-ON AlGaN/GaN HEMT through transient simulations

EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon ◽

10.1109/ulis.2015.7063752 ◽

2015 ◽

Author(s):

S. Strangio ◽

P. Magnone ◽

F. Crupi ◽

C. Fiegna ◽

C. Pace ◽

...

Keyword(s):

Gan Hemt ◽

Transient Simulations

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Experimental demonstration of planar SiGe on Si TFETs with counter doped pocket

EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon ◽

10.1109/ulis.2015.7063832 ◽

2015 ◽

Author(s):

S. Blaeser ◽

S. Richter ◽

S. Wirths ◽

S. Trellenkamp ◽

D. Buca ◽

...

Keyword(s):

Experimental Demonstration

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Spatial variability in large area single and few-layer CVD graphene

EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon ◽

10.1109/ulis.2015.7063779 ◽

2015 ◽

Cited By ~ 1

Author(s):

Clara F. Moldovan ◽

Krzysztof Gajewski ◽

Michele Tamagnone ◽

Robert S. Weatherup ◽

Hisashi Sugime ◽

...

Keyword(s):

Spatial Variability ◽

Large Area ◽

Cvd Graphene

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Study of high-temperature Smart Cut™: Application to thin films of single crystal silicon and silicon-on-sapphire films

EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon ◽

10.1109/ulis.2015.7063800 ◽

2015 ◽

Author(s):

Raphael Meyer ◽

Oleg Kononchuck ◽

Hubert Moriceau ◽

Mustapha Lemiti ◽

Michel Bruel

Keyword(s):

Thin Films ◽

High Temperature ◽

Single Crystal ◽

Single Crystal Silicon ◽

Crystal Silicon

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EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon
Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Effect of independently sized gates on the delay of reconfigurable silicon nanowire transistor based circuits

Quasi-static capacitance measurements in pseudo-MOSFET configuration for Dit extraction in SOI wafers

Ultra-low-power diodes using junctionless nanowire transistors

A simple analytical Variable Barrier Transistor drain current model

Comparison between vertical silicon NW-TFET and NW-MOSFETfrom analog point of view

Analytical approach to consider Gaussian junction profiles in compact models of tunnel-FETs

Toward understanding of donor-traps-related dispersion phenomena on normally-ON AlGaN/GaN HEMT through transient simulations

Experimental demonstration of planar SiGe on Si TFETs with counter doped pocket

Spatial variability in large area single and few-layer CVD graphene

Study of high-temperature Smart Cut™: Application to thin films of single crystal silicon and silicon-on-sapphire films

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EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on SiliconLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Effect of independently sized gates on the delay of reconfigurable silicon nanowire transistor based circuits

Quasi-static capacitance measurements in pseudo-MOSFET configuration for Dit extraction in SOI wafers

Ultra-low-power diodes using junctionless nanowire transistors

A simple analytical Variable Barrier Transistor drain current model

Comparison between vertical silicon NW-TFET and NW-MOSFETfrom analog point of view

Analytical approach to consider Gaussian junction profiles in compact models of tunnel-FETs

Toward understanding of donor-traps-related dispersion phenomena on normally-ON AlGaN/GaN HEMT through transient simulations

Experimental demonstration of planar SiGe on Si TFETs with counter doped pocket

Spatial variability in large area single and few-layer CVD graphene

Study of high-temperature Smart Cut™: Application to thin films of single crystal silicon and silicon-on-sapphire films

EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon
Latest Publications