Grafting of an aluminium surface with organic layers

RSC Advances ◽  
2016 ◽  
Vol 6 (82) ◽  
pp. 78369-78377 ◽  
Author(s):  
Avni Berisha ◽  
Hassan Hazimeh ◽  
Anouk Galtayries ◽  
Philippe Decorse ◽  
Frédéric Kanoufi ◽  
...  

The grafting of organic films on an aluminum surface is demonstrated by various methods: spontaneous reduction of aryldiazonium salts, and alkyl iodides, spontaneous reaction of perfluoroalkylamine and photochemical grafting of acetonitrile.

2011 ◽  
Vol 23 (15) ◽  
pp. 3449-3459 ◽  
Author(s):  
Avni Berisha ◽  
Catherine Combellas ◽  
Géraldine Hallais ◽  
Frédéric Kanoufi ◽  
Jean Pinson ◽  
...  

Author(s):  
Jun Liu ◽  
Katie E. Gunnison ◽  
Mehmet Sarikaya ◽  
Ilhan A. Aksay

The interfacial structure between the organic and inorganic phases in biological hard tissues plays an important role in controlling the growth and the mechanical properties of these materials. The objective of this work was to investigate these interfaces in nacre by transmission electron microscopy. The nacreous section of several different seashells -- abalone, pearl oyster, and nautilus -- were studied. Nacre is a laminated composite material consisting of CaCO3 platelets (constituting > 90 vol.% of the overall composite) separated by a thin organic matrix. Nacre is of interest to biomimetics because of its highly ordered structure and a good combination of mechanical properties. In this study, electron transparent thin sections were prepared by a low-temperature ion-beam milling procedure and by ultramicrotomy. To reveal structures in the organic layers as well as in the interfacial region, samples were further subjected to chemical fixation and labeling, or chemical etching. All experiments were performed with a Philips 430T TEM/STEM at 300 keV with a liquid Nitrogen sample holder.


1995 ◽  
Vol 189 (Part_2) ◽  
pp. 276-276
Author(s):  
H.-D. Dörfler

1998 ◽  
Author(s):  
Leo G. Henry ◽  
J.H. Mazur

Abstract The task of differentiating precisely between EOS and ESD failures continues to be a challenging one for Failure Analysis Engineers. Electrical OverStress (EOS) failures on the die surface (burnt/fused metallization) of an IC can be characterized mainly by the discoloration at the site of the failures. This is in direct contrast to the lack of discoloration characteristic of ESD failures, which occur almost exclusively below the die surface (oxide and junction failures). To aid in this distinction, this paper attempts to present the underlying physics behind the discoloration produced in the EOS failures. For the EOS failures, the metal fuses due to the longer pulse widths (sec to msec), while for the ESD failures, the silicon melts because of the shorter pulse widths (< < 500 nsec) and higher energy. After EOS, the aluminum surface becomes dark and rough and the oxide in the surrounding area becomes deformed and distorted, resulting in the discoloration observed in the light microscope. This EOS discoloration could be due to one or more of the following: 1) morphological and structural changes at the metal/glass interface and the glass itself; 2) changes in the thickness and scattering behavior of the glass and metal in the failed areas.


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