High resolution isotopic analysis of U-bearing particles via fusion of SIMS and EDS images

2016 ◽  
Vol 31 (7) ◽  
pp. 1472-1479 ◽  
Author(s):  
Jay G. Tarolli ◽  
Benjamin E. Naes ◽  
Benjamin J. Garcia ◽  
Ashley E. Fischer ◽  
David Willingham

The result of fusing energy-dispersive X-ray spectroscopy (EDS) and secondary ion mass spectrometry (SIMS) images of U-bearing particles.

Author(s):  
Lluís Yedra ◽  
C. N. Shyam Kumar ◽  
Alisa Pshenova ◽  
Esther Lentzen ◽  
Patrick Philipp ◽  
...  

The study demonstrates a new method to quantify Secondary Ion Mass Spectrometry (SIMS) images by using a synergetic combination of Energy Dispersive X-ray spectroscopy (EDX) and SIMS.


2014 ◽  
Vol 59 (2) ◽  
pp. 173-180 ◽  
Author(s):  
Bianca Kyriacou ◽  
Katie L. Moore ◽  
David Paterson ◽  
Martin D. de Jonge ◽  
Daryl L. Howard ◽  
...  

2008 ◽  
Vol 80 (15) ◽  
pp. 5986-5992 ◽  
Author(s):  
Sutapa Ghosal ◽  
Stewart J. Fallon ◽  
Terrance J. Leighton ◽  
Katherine E. Wheeler ◽  
Michael J. Kristo ◽  
...  

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