scholarly journals A correlative method to quantitatively image trace concentrations of elements by combined SIMS-EDX analysis

2021 ◽  
Author(s):  
Lluís Yedra ◽  
C. N. Shyam Kumar ◽  
Alisa Pshenova ◽  
Esther Lentzen ◽  
Patrick Philipp ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Energy Dispersive ◽  
New Method ◽  
X Ray ◽  
Edx Analysis ◽  
Ion Mass Spectrometry ◽  
Trace Concentrations ◽  
Secondary Ion

The study demonstrates a new method to quantify Secondary Ion Mass Spectrometry (SIMS) images by using a synergetic combination of Energy Dispersive X-ray spectroscopy (EDX) and SIMS.

High resolution isotopic analysis of U-bearing particles via fusion of SIMS and EDS images

2016 ◽  
Vol 31 (7) ◽  
pp. 1472-1479 ◽  
Author(s):  
Jay G. Tarolli ◽  
Benjamin E. Naes ◽  
Benjamin J. Garcia ◽  
Ashley E. Fischer ◽  
David Willingham
Keyword(s):  
Mass Spectrometry ◽  
High Resolution ◽  
Secondary Ion Mass Spectrometry ◽  
Isotopic Analysis ◽  
Energy Dispersive ◽  
X Ray ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

The result of fusing energy-dispersive X-ray spectroscopy (EDS) and secondary ion mass spectrometry (SIMS) images of U-bearing particles.

Localization of iron in rice grain using synchrotron X-ray fluorescence microscopy and high resolution secondary ion mass spectrometry

2014 ◽  
Vol 59 (2) ◽  
pp. 173-180 ◽  
Author(s):  
Bianca Kyriacou ◽  
Katie L. Moore ◽  
David Paterson ◽  
Martin D. de Jonge ◽  
Daryl L. Howard ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
High Resolution ◽  
Fluorescence Microscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Rice Grain ◽  
X Ray ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Secondary-ion mass spectrometry and x-ray photo-electron spectroscopy analyses of -irradiated Bi-2212 superconductors

1996 ◽  
Vol 29 (11) ◽  
pp. 2745-2749 ◽  
Author(s):  
A Bhattacharyay ◽  
P Rajasekar ◽  
P Chakraborty ◽  
S K Bandyopadhyay ◽  
P Barat ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Electron Spectroscopy ◽  
Secondary Ion Mass Spectrometry ◽  
X Ray ◽  
Ion Mass Spectrometry ◽  
Secondary Ion
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