In situaccurate and precise lead isotopic analysis of ultra-small analyte volumes (10–16m3) of solid inorganic samples by high mass resolution secondary ion mass spectrometry

1998 ◽  
Vol 13 (7) ◽  
pp. 597-601 ◽  
Author(s):  
Paul W. O. Hoskin ◽  
Richard J. Wysoczanski
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Isotopic Analysis ◽  
Mass Resolution ◽  
High Mass ◽  
High Mass Resolution ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Simultaneous quantitative determination of the distribution of dopants in silicon by high mass resolution secondary ion mass spectrometry

1989 ◽  
Vol 61 (5) ◽  
pp. 412-416 ◽  
Author(s):  
Gerhard. Stingeder ◽  
Kurt. Piplits ◽  
Stefan. Gara ◽  
Manfred. Grasserbauer ◽  
Matthias. Budil ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Quantitative Determination ◽  
Secondary Ion Mass Spectrometry ◽  
Mass Resolution ◽  
High Mass ◽  
High Mass Resolution ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

scholarly journals Helium ion microscope – secondary ion mass spectrometry for geological materials

2020 ◽  
Vol 11 ◽  
pp. 1504-1515
Author(s):  
Matthew R Ball ◽  
Richard J M Taylor ◽  
Joshua F Einsle ◽  
Fouzia Khanom ◽  
Christelle Guillermier ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Beam ◽  
Isotopic Analysis ◽  
Green Economy ◽  
Case Scenario ◽  
Helium Ion ◽  
Ion Mass Spectrometry ◽  
Focussed Ion Beam ◽  
Secondary Ion

The helium ion microscope (HIM) is a focussed ion beam instrument with unprecedented spatial resolution for secondary electron imaging but has traditionally lacked microanalytical capabilities. With the addition of the secondary ion mass spectrometry (SIMS) attachment, the capabilities of the instrument have expanded to microanalysis of isotopes from Li up to hundreds of atomic mass units, effectively opening up the analysis of all natural and geological systems. However, the instrument has thus far been underutilised by the geosciences community, due in no small part to a lack of a thorough understanding of the quantitative capabilities of the instrument. Li represents an ideal element for an exploration of the instrument as a tool for geological samples, due to its importance for economic geology and a green economy, and the difficult nature of observing Li with traditional microanalytical techniques. Also Li represents a “best-case” scenario for isotopic measurements. Here we present details of sample preparation, instrument sensitivity, theoretical, and measured detection limits for both elemental and isotopic analysis as well as practicalities for geological sample analyses of Li alongside a discussion of potential geological use cases of the HIM–SIMS instrument.

In situ oxygen isotopic analysis of aragonite by secondary ion mass spectrometry with a new reference material

2021 ◽  
Author(s):  
Miaohong He ◽  
Tianyu Chen ◽  
Xi Liu ◽  
Ya-Nan Yang ◽  
Xiaoping Xia ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Isotopic Analysis ◽  
Mass Fractionation ◽  
Isotopic Analyses ◽  
Ion Mass Spectrometry ◽  
Oxygen Isotopic ◽  
Secondary Ion ◽  
Oxygen Isotopic Analysis

Accurate oxygen isotopic analysis of aragonite by secondary ion mass spectrometry (SIMS) requires appropriate reference materials to calibrate systems for instrumental mass fractionation. Several hundred SIMS oxygen isotopic analyses were...

A discussion on mass resolution in secondary ion mass spectrometry

2019 ◽  
Vol 52 (5) ◽  
pp. 249-255
Author(s):  
Zhanping Li ◽  
Lixia Zhao ◽  
Bing Xiong ◽  
Runlong Fan ◽  
Dunyi Liu ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Mass Resolution ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

High Mass Resolution Plasma Desorption and Secondary Ion Mass Spectrometry of Neutral Nickel Thiolate Complexes. Crystal Structure of [Ni6(SC3H7)12]

1992 ◽  
Vol 47 (7) ◽  
pp. 929-936 ◽  
Author(s):  
Herbert Feld ◽  
Angelika Leute ◽  
Derk Rading ◽  
Alfred Benninghoven ◽  
G. Henkel ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Metal Complexes ◽  
Secondary Ion Mass Spectrometry ◽  
Molecular Ions ◽  
Cluster Ions ◽  
High Mass ◽  
Plasma Desorption ◽  
Ion Mass Spectrometry ◽  
Thiolate Complexes ◽  
Secondary Ion

The use of mass spectrometry for the analysis of transition metal complexes is demonstrated by combined high resolution Plasma Desorption Mass Spectrometry (PDMS) and Secondary Ion Mass Spectrometry (SIMS) investigations of the neutral nickel thiolate complexes [Ni4(SC3H7)8] (1), [Ni4(SC6H11)8] (2), [Ni8(SCH2COOEt)16] (3) and [Ni6(SC3H7)12] (4). The positive spectra are dominated by three kinds of SI-species: (a) molecular ions, (b) fragment ions and (c) molecular ions with one or more substrate atoms attached. The negative spectra show mainly nickel sulfur cluster ions of the composition (NixSy)-. In contrast to many Fast Atom Bombardment (FAB) spectra of neutral metal complexes, SIMS and PDMS spectra provide molecular weight as well as fragment ion information. Both techniques are most powerful tools for the investigation of coordination compounds because the samples are easy to prepare and the spectra are independent of matrix conditions. Additionally crystallographic studies have been carried out for 4. The hexanuclear complex 4 with square planar Ni-S coordination sites crystallizes in the trigonal space group R 3̅ with Z = 3 and α = 18.537(5), c = 13.966(3) Å.

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