Bridging structure and mechanics of three-dimensional porous hydrogel with X-ray ultramicroscopy and atomic force microscopy

RSC Advances ◽  
2015 ◽  
Vol 5 (78) ◽  
pp. 63909-63916 ◽  
Author(s):  
A. Y. Abuelfilat ◽  
Y. Kim ◽  
P. Miller ◽  
S. P. Hoo ◽  
J. Li ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Phase Contrast ◽  
Three Dimensional ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Collective Performance ◽  
Porous Hydrogel

By combining phase contrast X-ray ultramicroscopy and nanoindentation with atomic force microscopy, the mechanics of individual hydrogel pores as well as their collective performance as a scaffold can be modelled and simulated.

Nitridation of Substrates With Hydrazine Cyanurate for The Growth of Gallium Nitride

1998 ◽  
Vol 512 ◽  
Author(s):  
T. J. Kropewnicki ◽  
P. A. Kohl
Keyword(s):  
Atomic Force Microscopy ◽  
Chemical Composition ◽  
Low Temperature ◽  
Surface Morphology ◽  
Photoelectron Spectroscopy ◽  
Three Dimensional ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dimensional Growth

ABSTRACTThe use of purified hydrazine cyanurate as a solid source of hydrazine in the low temperature nitridation of GaAs (100) and (111) and sapphire (0001) is demonstrated. Thenitridated surfaces were analyzed by X-ray Photoelectron Spectroscopy (XPS) for chemical composition and Atomic Force Microscopy for surface morphology. The GaAs surfaces were composed primarily of GaN, GaAs, and Ga2O3, and were as smooth as unprocessed standards. The nitridated sapphire surfaces were composed of A1NxO1-x and exhibited three-dimensional growth for long nitridation times.

Three-dimensional readout of flash x-ray images of living sperm in water by atomic-force microscopy

Science ◽  
1991 ◽  
Vol 252 (5006) ◽  
pp. 691-693 ◽  
Author(s):  
T Tomie ◽  
H Shimizu ◽  
T Majima ◽  
M Yamada ◽  
T Kanayama ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Three Dimensional ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force

Atomic Force Microscopy and X-ray Studies of Three-Dimensional Islands on Monolayers

Langmuir ◽  
1997 ◽  
Vol 13 (24) ◽  
pp. 6577-6581 ◽  
Author(s):  
K. Meine ◽  
G. Weidemann ◽  
D. Vollhardt ◽  
G. Brezesinski ◽  
E. A. Kondrashkina
Keyword(s):  
Atomic Force Microscopy ◽  
Three Dimensional ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Acoustic subsurface-atomic force microscopy: Three-dimensional imaging at the nanoscale

2021 ◽  
Vol 129 (3) ◽  
pp. 030901
Author(s):  
Hossein J. Sharahi ◽  
Mohsen Janmaleki ◽  
Laurene Tetard ◽  
Seonghwan Kim ◽  
Hamed Sadeghian ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Three Dimensional ◽  
Three Dimensional Imaging ◽  
Force Microscopy ◽  
Atomic Force

Nanocrystalline Solutions as Precursors to The Spray Deposition of Cdte Thin Films

1995 ◽  
Vol 382 ◽  
Author(s):  
Martin Pehnt ◽  
Douglas L. Schulz ◽  
Calvin J. Curtis ◽  
Helio R. Moutinho ◽  
Amy Swartzlander ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Grain Size ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Cdte Nanoparticles ◽  
Atomic Force ◽  
Vis Spectroscopy ◽  
Cdte Thin Films

ABSTRACTIn this article we report the first nanoparticle-derived route to smooth, dense, phase-pure CdTe thin films. Capped CdTe nanoparticles were prepared by injection of a mixture of Cd(CH3)2, (n-C8H17)3 PTe and (n-C8H17)3P into (n-C8H17)3PO at elevated temperatures. The resultant nanoparticles 32-45 Å in diameter were characterized by x-ray diffraction, UV-Vis spectroscopy, transmission electron microscopy, thermogravimetric analysis and energy dispersive x-ray spectroscopy. CdTe thin film deposition was accomplished by dissolving CdTe nanoparticles in butanol and then spraying the solution onto SnO2-coated glass substrates at variable susceptor temperatures. Smooth and dense CdTe thin films were obtained using growth temperatures approximately 200 °C less than conventional spray pyrolysis approaches. CdTe films were characterized by x-ray diffraction, UV-Vis spectroscopy, atomic force microscopy, and Auger electron spectroscopy. An increase in crystallinity and average grain size as determined by x-ray diffraction was noted as growth temperature was increased from 240 to 300 °C. This temperature dependence of film grain size was further confirmed by atomic force microscopy with no remnant nanocrystalline morphological features detected. UV-Vis characterization of the CdTe thin films revealed a gradual decrease of the band gap (i.e., elimination of nanocrystalline CdTe phase) as the growth temperature was increased with bulk CdTe optical properties observed for films grown at 300 °C.

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