Pattern formation induced by an electric field in a polymer–air–polymer thin film system

Soft Matter ◽  
2012 ◽  
Vol 8 (23) ◽  
pp. 6333 ◽  
Author(s):  
George Amarandei ◽  
Philippe Beltrame ◽  
Ian Clancy ◽  
Colm O'Dwyer ◽  
Arousian Arshak ◽  
...  
Keyword(s):  
Thin Film ◽  
Pattern Formation ◽  
Electric Field ◽  
Film System ◽  
Polymer Thin Film ◽  
Thin Film System

scholarly journals Pattern formation in a polymer thin film induced by an in-plane electric field

2004 ◽  
Vol 85 (7) ◽  
pp. 1161-1163 ◽  
Author(s):  
David Salac ◽  
Wei Lu ◽  
Chia-Wei Wang ◽  
Ann Marie Sastry
Keyword(s):  
Thin Film ◽  
Pattern Formation ◽  
Electric Field ◽  
Polymer Thin Film

Granular magnetic cobalt metal/polymer thin film system

1996 ◽  
Vol 32 (5) ◽  
pp. 4475-4477 ◽  
Author(s):  
Jongill Hong ◽  
E. Kay ◽  
S.X. Wang
Keyword(s):  
Thin Film ◽  
Cobalt Metal ◽  
Film System ◽  
Polymer Thin Film ◽  
Thin Film System ◽  
Metal Polymer

scholarly journals Electric Field Behavior with Current for Bipbsrcacuznxo Thin Film System

2017 ◽  
Vol 28 (1) ◽  
pp. 154
Author(s):  
Suzan M. Shakouli
Keyword(s):  
Thin Film ◽  
Electric Field ◽  
Film System ◽  
Linear Region ◽  
Thin Film System ◽  
Field Behavior

In this search the investigation of electric field behavior with current for BiPbSrCaCuZnxO film at (x=0, 0.2, 0.4, 0.6, 0.8, 1). Where observed two regions, first (linear region) field be constant nearly, and another region increase quickly.

scholarly journals Misfit Strain Relaxation of Ferroelectric PbTiO3/LaAlO3 (111) Thin Film System

2016 ◽  
Vol 6 (1) ◽  
Author(s):  
Y. B. Xu ◽  
Y. L. Tang ◽  
Y. L. Zhu ◽  
Y. Liu ◽  
S. Li ◽  
...  
Keyword(s):  
Thin Film ◽  
Strain Relaxation ◽  
Misfit Strain ◽  
Film System ◽  
Thin Film System

Quantitative Study of Al/W Interaction In Si/SiO2/W-Ti/Al Thin Film System

1988 ◽  
Vol 119 ◽  
Author(s):  
Hung-Yu Liu ◽  
Peng-Heng Chang ◽  
Jim Bohlman ◽  
Hun-Lian Tsai
Keyword(s):  
Thin Film ◽  
Film System ◽  
X Ray Diffraction ◽  
Compound Formation ◽  
X Ray ◽  
Thin Film System ◽  
Glancing Angle ◽  
Integrated Intensity ◽  
Al Thin Film ◽  
Kinetics Of

AbstractThe interaction of Al and W in the Si/SiO2/W-Ti/Al thin film system is studied quantitatively by glancing angle x-ray diffraction. The formation of Al-W compounds due to annealing is monitored by the variation of the integrated intensity from a few x-ray diffraction peaks of the corresponding compounds. The annealing was conducted at 400°C, 450°C and 500°C from 1 hour to 300 hours. The kinetics of compound formation is determined using x-ray diffraction data and verified by TEM observations. We will also show the correlation of the compound formation to the change of the electrical properties of these films.

High Current Density Effect on In-situ Atomic Migration Characteristics of a BiTe Thin Film System

2013 ◽  
Vol 52 (10S) ◽  
pp. 10MC06
Author(s):  
Seunghyun Kim ◽  
Yong-Jin Park ◽  
Young-Chang Joo ◽  
Young-Bae Park
Keyword(s):  
Thin Film ◽  
Current Density ◽  
High Current Density ◽  
Density Effect ◽  
Film System ◽  
High Current ◽  
Thin Film System

scholarly journals Nanoscale diffusion in Pt/56Fe/57Fe thin-film system

2015 ◽  
Vol 589 ◽  
pp. 173-181 ◽  
Author(s):  
A. Tynkova ◽  
G.L. Katona ◽  
G. Erdélyi ◽  
L. Daróczi ◽  
А.I. Oleshkevych ◽  
...  
Keyword(s):  
Thin Film ◽  
Film System ◽  
Thin Film System

Linear, third order nonlinear and optical limiting studies on MZO/FTO thin film system fabricated by spin coating technique for electro-optic applications

2018 ◽  
Vol 33 (22) ◽  
pp. 3880-3889 ◽  
Author(s):  
Mohd. Shkir ◽  
Mohd. Arif ◽  
Vanga Ganesh ◽  
Mohamed A. Manthrammel ◽  
Arun Singh ◽  
...  
Keyword(s):  
Thin Film ◽  
Spin Coating ◽  
Optical Limiting ◽  
Spin Coating Technique ◽  
Film System ◽  
Third Order ◽  
Coating Technique ◽  
Thin Film System ◽  
Electro Optic ◽  
Image Position

Abstract

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