Studies on the quantitative analysis of trace elements in single SiC crystals using laser ablation-ICP-MS
1999 ◽
Vol 14
(11)
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pp. 1679-1684
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2000 ◽
Vol 15
(8)
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pp. 1001-1008
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2000 ◽
Vol 368
(1)
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pp. 79-87
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Keyword(s):
1993 ◽
Vol 57
(23-24)
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pp. 5099-5103
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2001 ◽
Vol 72
(2)
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pp. 81-89
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2000 ◽
Vol 366
(2)
◽
pp. 167-170
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2016 ◽
Vol 31
(1)
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pp. 270-279
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