scholarly journals Scanning angle interference microscopy reveals cell dynamics at the nanoscale

2012 ◽  
Vol 9 (8) ◽  
pp. 825-827 ◽  
Author(s):  
Matthew J Paszek ◽  
Christopher C DuFort ◽  
Matthew G Rubashkin ◽  
Michael W Davidson ◽  
Kurt S Thorn ◽  
...  
Keyword(s):  
Interference Microscopy ◽  
Cell Dynamics ◽  
Scanning Angle

Scanning Angle Interference Microscopy (SAIM)

2020 ◽  
pp. 39-61
Author(s):  
Cristina Bertocchi ◽  
Timothy J. Rudge ◽  
Andrea Ravasio
Keyword(s):  
Interference Microscopy ◽  
Scanning Angle

scholarly journals An acquisition and analysis pipeline for scanning angle interference microscopy

2016 ◽  
Vol 13 (11) ◽  
pp. 897-898 ◽  
Author(s):  
Catherine B Carbone ◽  
Ronald D Vale ◽  
Nico Stuurman
Keyword(s):  
Interference Microscopy ◽  
Analysis Pipeline ◽  
Scanning Angle

scholarly journals High-speed device synchronization in optical microscopy with an open-source hardware control platform

2019 ◽  
Author(s):  
Marshall J. Colville ◽  
Sangwoo Park ◽  
Warren R. Zipfel ◽  
Matthew J. Paszek
Keyword(s):  
Open Source ◽  
High Speed ◽  
Interference Microscopy ◽  
Scanning Angle ◽  
Precise Control ◽  
Synchronization Errors ◽  
Waveform Generation ◽  
High Speeds ◽  
Control And Synchronization ◽  
Open Source Hardware

AbstractRecent advances in fluorescence microscopy have enabled the visualization of subcellular structures at unprecedented resolution. However, the complexity of state-of-the-art microscopes has increased considerably, often requiring the precise control and synchronization of multiple peripheral devices at high speeds. Drawing inspiration from open-source prototyping systems, like the Arduino, we describe the development of a new control platform that adopts the best features of these systems – affordability, facile programmability, and flexible connectivity – but with the scientific-grade inputs and outputs (I/O) and built-in routines that are necessary to control peripherals in advanced microscopy applications. Notably, our platform includes waveform generators and I/O for point-and azimuthal-scanning of excitation in laser-based applications. As a proof of concept, we show how the integration of waveform generation, multiplexed analog outputs, and native hardware triggers into a single central hub provides a versatile platform for performing fast circle-scanning acquisitions, including ring scanning-angle interference microscopy (SAIM), total internal reflection fluorescence (TIRF and ring TIRF) microscopy, and multiangle TIRF (MA-TIRF). We also demonstrate how the low communication latency of our hardware platform can reduce image intensity and reconstruction artifacts arising from synchronization errors produced by software control. Our complete platform, including hardware design files, firmware, API, software, and all associated source code, will be hosted for community-based development and collaboration.

scholarly journals Interference Microscopy under Double-Wavelet Analysis: A New Approach to Studying Cell Dynamics

2005 ◽  
Vol 94 (21) ◽  
Author(s):  
O. V. Sosnovtseva ◽  
A. N. Pavlov ◽  
N. A. Brazhe ◽  
A. R. Brazhe ◽  
L. A. Erokhova ◽  
...  
Keyword(s):  
Wavelet Analysis ◽  
Interference Microscopy ◽  
Cell Dynamics ◽  
New Approach

scholarly journals A data acquisition and analysis pipeline for scanning angle interference microscopy

2016 ◽  
Author(s):  
Catherine B. Carbone ◽  
Ronald D. Vale ◽  
Nico Stuurman
Keyword(s):  
Data Acquisition ◽  
Open Source ◽  
Open Source Software ◽  
Interference Microscopy ◽  
Analysis Pipeline ◽  
Scanning Angle ◽  
Software And Hardware

AbstractWe describe open source software and hardware tools for calibrating, acquiring, and analyzing images for scanning angle interference microscopy (SAIM) analysis. These tools make it possible for any user with a TIRF microscope equipped with a motorized illumination unit to generate reconstructed images with nanometer precision in the axial (z) direction and diffraction-limited resolution in the lateral (xy) plane.

scholarly journals Wavelet-based analysis of cell dynamics measured by interference microscopy

2009 ◽  
Vol 1 (1) ◽  
pp. 77-83 ◽  
Author(s):  
A. R. Brazhe ◽  
N. A. Brazhe ◽  
O. V. Sosnovtseva ◽  
A. N. Pavlov ◽  
E. Mosekilde ◽  
...  
Keyword(s):  
Interference Microscopy ◽  
Cell Dynamics

Scanning Electron Microscopy and Electron Microprobe Analysis of Malignant Cell Cultures

1968 ◽  
Vol 26 ◽  
pp. 164-165
Author(s):  
R. I. Johnsson-Hegyeli ◽  
A. F. Hegyeli ◽  
D. K. Landstrom ◽  
W. C. Lane
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Cell Cultures ◽  
Electron Microprobe ◽  
Microprobe Analysis ◽  
Electron Microprobe Analysis ◽  
Three Dimensional ◽  
Malignant Cell ◽  
Interference Microscopy ◽  
Scanning Electron

Last year we reported on the use of reflected light interference microscopy (RLIM) for the direct color photography of the surfaces of living normal and malignant cell cultures without the use of replicas, fixatives, or stains. The surface topography of living cells was found to follow underlying cellular structures such as nuceloli, nuclear membranes, and cytoplasmic organelles, making possible the study of their three-dimensional relationships in time. The technique makes possible the direct examination of cells grown on opaque as well as transparent surfaces. The successful in situ electron microprobe analysis of the elemental composition and distribution within single tissue culture cells was also reported.This paper deals with the parallel and combined use of scanning electron microscopy (SEM) and the two previous techniques in a study of living and fixed cancer cells. All three studies can be carried out consecutively on the same experimental specimens without disturbing the cells or their structural relationships to each other and the surface on which they are grown. KB carcinoma cells were grown on glass coverslips in closed Leighto tubes as previously described. The cultures were photographed alive by means of RLIM, then fixed with a fixative modified from Sabatini, et al (1963).

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