Detection of environmental fine structure in the low-energy β-decay spectrum of 187Re

Nature ◽  
10.1038/16414 ◽  
1999 ◽  
Vol 397 (6715) ◽  
pp. 137-139 ◽  
Author(s):  
F. Gatti ◽  
F. Fontanelli ◽  
M. Galeazzi ◽  
A. M. Swift ◽  
S. Vitale
Author(s):  
I. P. Korenkov ◽  
A. I. Ermakov ◽  
A. B. Mayzik ◽  
T. N. Laschenova ◽  
V. N. Klochkov ◽  
...  

The aim of the study is to evaluate the volume activity of radioactive waste (RW) by surface and specific alpha contamination using portable gamma-spectrometry.Materials and methods. Methods of rapid assessment of the content of α-emitting radionuclides in solid waste of various morphologies using gamma-spectrometers based on germanium detectors are considered. Computational methods for determining the effectiveness of radionuclide registration are presented.Results. The possibility of using portable gamma-ray spectrometry to assess the surface and specific activity of various materials contaminated with α-emitters (232Th, 235U, 238U, 237Np, 239Pu, 240Pu and 241Am) is shown. The calculated values of the registration efficiency of low-energy gamma-emitters obtained by modeling the spatial-energy parameters of the detector are given.To simplify the solution of this problem, the calculation program used 20 standard templates of various geometries (rectangular, cylindrical, conical, spherical, etc.). The main sources of error in the survey of contaminated surfaces, largesized equipment and building structures were investigated.Conclusions. The possibilities of portable γ-spectrometry for estimating the volume of RW based on the surface density of contamination of materials with radionuclides of uranium and transuranic elements are investigated. When using γ-spectrometer with a high-purity germanium detector with a range of γ-quanta extended in the low-energy region, radionuclides such as 232Th, 235U,238U, 237Np, 241Am were determined by their own radiation or by the radiation of their daughter products.The “problem” element is plutonium, for rapid evaluation of which it is proposed, in accordance with the radionuclide vector methodology, to use 241Am, which accumulates during the β-decay of 241Pu.According to calculations, the most likely value of the activity ratio 239Pu/241Am for the object where the work was performed (scaling factor) varies in the range from 5.0 to 9.0.Based on the results of calculations and experimental studies, the parameters of the efficiency of registration of various α-emitting radionuclides by portable γ-spectrometers. It has been found that for germanium detectors with an absolute efficiency of registering a point source of 7÷15%, it is n×10–5÷n×10–4%.


1985 ◽  
Vol 32 (10) ◽  
pp. 6131-6137 ◽  
Author(s):  
J.-M. Baribeau ◽  
J.-D. Carette ◽  
P. J. Jennings ◽  
R. O. Jones

1994 ◽  
Vol 99 (A3) ◽  
pp. 4131 ◽  
Author(s):  
Chao Liu ◽  
J. D. Perez ◽  
T. E. Moore ◽  
C. R. Chappell ◽  
J. A. Slavin

1968 ◽  
Vol 20 (12) ◽  
pp. 614-616 ◽  
Author(s):  
S. E. Derenzo ◽  
R. H. Hildebrand
Keyword(s):  

1989 ◽  
Vol 67 (4) ◽  
pp. 358-364 ◽  
Author(s):  
G. W. Johnson ◽  
D. E. Brodie ◽  
E. D. Crozier

In this study, thin films of germanium have been vacuum deposited in four regimes. Care was taken to prepare reproducible films, which required that the partial pressure of water be below 10−8 Torr during deposition (1 Torr = 133.3 Pa). First, films deposited onto substrates held during deposition at a temperature Ts that is below 473 K are amorphous. Once annealed above 423 K, their electrical conductivity and optical band gap are independent of deposition temperature and rate, and of whether or not low-energy electron irradiation of the substrate is used during deposition. This suggests that a well-defined and reproducible structure is being prepared. Second, a "precrystallization regime" is obtained when Ts is between 473 and 513 K. Extended X-ray adsorption fine-structure and X-ray diffraction confirm that this regime is a two-phase mixture of amorphous material and crystallites. Third, films deposited with Ts near 513 K, while using low-energy electrons to bombard the substrate, are amorphous, but these films have different electrical and optical properties from the films m the first regime. From this, we infer that a second well-defined amorphous structure exists. Fourth, films deposited with Ts above 513 K are polycrystalline. Extended X-ray adsorption fine-structure and X-ray adsorption near-edge structure could not distinguish between the two amorphous materials in the first and third regimes.


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