Full-Scale Characterization of UVLED AlxGa1–xN Nanowires via Advanced Electron Microscopy

ACS Nano ◽  
2013 ◽  
Vol 7 (6) ◽  
pp. 5045-5051 ◽  
Author(s):  
Patrick J. Phillips ◽  
Santino D. Carnevale ◽  
Rajan Kumar ◽  
Roberto C. Myers ◽  
Robert F. Klie
Keyword(s):  
Electron Microscopy ◽  
Full Scale ◽  
Scale Characterization

scholarly journals Full-Scale Characterization of UVLED AlxGa1-xN Nanowires Via Advanced Electron Microscopy

2013 ◽  
Vol 19 (S2) ◽  
pp. 1520-1521
Author(s):  
P. Phillips ◽  
S. Carnevale ◽  
R. Kumar ◽  
R. Myers ◽  
R.F. Klie
Keyword(s):  
Electron Microscopy ◽  
Full Scale ◽  
Scale Characterization

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

scholarly journals Micro and Nanoscale Characterization of Complex Multilayer-Structured White Etching Layer in Rails

Metals ◽  
2018 ◽  
Vol 8 (10) ◽  
pp. 749 ◽  
Author(s):  
Jun Wu ◽  
Roumen Petrov ◽  
Sebastian Kölling ◽  
Paul Koenraad ◽  
Loic Malet ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Rail Steel ◽  
Electron Backscatter Diffraction ◽  
Thickness Distribution ◽  
Atom Probe ◽  
Transmission Electron ◽  
Nanoscale Characterization ◽  
Scale Characterization

Micro- to nano-scale characterization of the microstructures in the white etching layer (WEL), observed in a Dutch R260 Mn grade rail steel, was performed via various techniques. Retained austenite in the WEL was identified via electron backscatter diffraction (EBSD), automatic crystallographic orientation mapping in transmission electron microscopy (ACOM-TEM), and X-ray diffraction (XRD). EBSD and ACOM-TEM methods were used to quantify grains (size range: 50 nm–4 μm) in the WEL. Transmission electron microscopy (TEM) was used to identify complex heterogeneous microstructural morphologies in the WEL: Nano-twinning substructure with high dislocation density in the WEL close to the rail surface and untransformed cementite and dislocations in the WEL close to the pearlite matrix. Furthermore, atom probe tomography (APT) revealed a heterogeneous through-thickness distribution of alloying elements in the WEL. Accordingly, the WEL is considered a multi-layered martensitic microstructure. These findings are supported by the temperature calculations from the shape analysis of the manganese profile from APT measurements, related to manganese diffusion. The deformation characteristics of the WEL and the pearlite beneath the WEL are discussed based on the EBSD measurements. The role of deformation in the martensitic phase transformation for WEL formation is discussed.

scholarly journals Atomic-Scale Characterization of Metals and Alloys Using Spherical-Aberration Corrected Scanning Transmission Electron Microscopy

2006 ◽  
Vol 12 (S02) ◽  
pp. 1344-1345
Author(s):  
D Williams ◽  
M Watanabe
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Spherical Aberration ◽  
Atomic Scale ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Scale Characterization ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Nanometer to micrometer scale characterization of pore networks in fine-grained rocks using electron microscopy and small angle neutron scattering

2012 ◽  
Vol 18 (S2) ◽  
pp. 1954-1955 ◽  
Author(s):  
A. Navarre-Sitchler ◽  
K. Mouzakis ◽  
J. McCray ◽  
G. Rother ◽  
T. Dewers ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Neutron Scattering ◽  
Small Angle ◽  
Small Angle Neutron Scattering ◽  
Pore Networks ◽  
Fine Grained ◽  
Scale Characterization ◽  
Micrometer Scale

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

scholarly journals Imaging atomic motion of light elements in 2D materials with 30 kV electron microscopy

Nanoscale ◽  
2021 ◽  
Author(s):  
Sytze de Graaf ◽  
Majid Ahmadi ◽  
Ivan Lazić ◽  
Eric Bosch ◽  
Bart J. Kooi
Keyword(s):  
Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
2D Materials ◽  
Atomic Scale ◽  
Atomic Motion ◽  
Light Elements ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Scale Characterization

Scanning transmission electron microscopy (STEM) is the most widespread adopted tool for atomic scale characterization of two-dimensional (2D) materials. However, damage free imaging of 2D materials with electrons has remained...

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