Atomic-scale characterization of a Co/AlOx/Co magnetic tunnel junction by scanning transmission electron microscopy

2001 ◽  
Vol 79 (3) ◽  
pp. 391-393 ◽  
Author(s):  
M. J. Plisch ◽  
J. L. Chang ◽  
J. Silcox ◽  
R. A. Buhrman
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Tunnel Junction ◽  
Scanning Transmission Electron Microscopy ◽  
Magnetic Tunnel Junction ◽  
Atomic Scale ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Scale Characterization

scholarly journals Atomic-Scale Characterization of Metals and Alloys Using Spherical-Aberration Corrected Scanning Transmission Electron Microscopy

2006 ◽  
Vol 12 (S02) ◽  
pp. 1344-1345
Author(s):  
D Williams ◽  
M Watanabe
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Spherical Aberration ◽  
Atomic Scale ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Scale Characterization ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

scholarly journals Imaging atomic motion of light elements in 2D materials with 30 kV electron microscopy

Nanoscale ◽  
2021 ◽  
Author(s):  
Sytze de Graaf ◽  
Majid Ahmadi ◽  
Ivan Lazić ◽  
Eric Bosch ◽  
Bart J. Kooi
Keyword(s):  
Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
2D Materials ◽  
Atomic Scale ◽  
Atomic Motion ◽  
Light Elements ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Scale Characterization

Scanning transmission electron microscopy (STEM) is the most widespread adopted tool for atomic scale characterization of two-dimensional (2D) materials. However, damage free imaging of 2D materials with electrons has remained...

scholarly journals Atomic-Scale Analysis of Chemical Bonding of Delaminated Graphene at Faceted SiC by Aberration-Corrected Scanning Transmission Electron Microscopy

2013 ◽  
Vol 19 (S2) ◽  
pp. 1238-1239
Author(s):  
G. Nicotra ◽  
Q.M. Ramasse ◽  
I. Deretzis ◽  
C. Bongiorno ◽  
C. Spinella ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Chemical Bonding ◽  
Scanning Transmission Electron Microscopy ◽  
Atomic Scale ◽  
Scale Analysis ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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