scholarly journals Correlating Raman Spectral Signatures with Carrier Mobility in Epitaxial Graphene: A Guide to Achieving High Mobility on the Wafer Scale

Nano Letters ◽  
2009 ◽  
Vol 9 (8) ◽  
pp. 2873-2876 ◽  
Author(s):  
Joshua A. Robinson ◽  
Maxwell Wetherington ◽  
Joseph L. Tedesco ◽  
Paul M. Campbell ◽  
Xiaojun Weng ◽  
...  
2010 ◽  
Vol 97 (25) ◽  
pp. 252101 ◽  
Author(s):  
Wei Pan ◽  
Stephen W. Howell ◽  
Anthony Joseph Ross ◽  
Taisuke Ohta ◽  
Thomas A. Friedmann

2009 ◽  
Vol 95 (22) ◽  
pp. 223108 ◽  
Author(s):  
Xiaosong Wu ◽  
Yike Hu ◽  
Ming Ruan ◽  
Nerasoa K Madiomanana ◽  
John Hankinson ◽  
...  

2015 ◽  
Author(s):  
Mikael Karlsson ◽  
Qin Wang ◽  
Yichen Zhao ◽  
Wei Zhao ◽  
Muhammet S. Toprak ◽  
...  

Author(s):  
Mehdi Asheghi

There have been many attempts in the recent years to improve the device performance by enhancing carrier mobility by using the strained-induced changes in silicon electronic bands [1–4] or reducing the junction capacitance in silicon-on-insulator (SOI) technology. Strained silicon on insulator (SSOI) is another promising technology, which is expected to show even higher performance, in terms of speed and power consumption, comparing to the regular strained-Si transistors. In this technology, the strained silicon is incorporated in the silicon on insulator (SOI) technology such that the strained-Si introduces high mobility for electrons and holes and the insulator layer (usually SiO2) exhibits low junction capacitance due to its small dielectric constant [5, 6]. In these devices a layer of SiGe may exist between the strined-Si layer and insulator (strained Si-on-SiGe-on-insulator, SGOI) [6] or the strained-Si layer can be directly on top of the insulator [7]. Latter is advantageous for eliminating some of the key problems associated with the fabrication of SGOI.


2020 ◽  
Vol 22 (4) ◽  
pp. 2276-2282 ◽  
Author(s):  
Ruhao Fang ◽  
Xiangyuan Cui ◽  
Catherine Stampfl ◽  
Simon P. Ringer ◽  
Rongkun Zheng

The exceptionally low deformation potential is proposed as the key determinant for the high carrier mobility in ten possible α-phosphorene isostructures.


2D Materials ◽  
2017 ◽  
Vol 4 (2) ◽  
pp. 021004 ◽  
Author(s):  
Vaidotas Miseikis ◽  
Federica Bianco ◽  
Jérémy David ◽  
Mauro Gemmi ◽  
Vittorio Pellegrini ◽  
...  

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