Island Nucleation and Growth Dynamics during Submonolayer Vapor Deposition Polymerization

2010 ◽  
Vol 43 (12) ◽  
pp. 5450-5454 ◽  
Author(s):  
I.J. Lee ◽  
Mira Yun
Author(s):  
D. A. Smith

The nucleation and growth processes which lead to the formation of a thin film are particularly amenable to investigation by transmission electron microscopy either in situ or subsequent to deposition. In situ studies have enabled the observation of island nucleation and growth, together with addition of atoms to surface steps. This paper is concerned with post-deposition crystallization of amorphous alloys. It will be argued that the processes occurring during low temperature deposition of one component systems are related but the evidence is mainly indirect. Amorphous films result when the deposition conditions such as low temperature or the presence of impurities (intentional or unintentional) preclude the atomic mobility necessary for crystallization. Representative examples of this behavior are CVD silicon grown below about 670°C, metalloids, such as antimony deposited at room temperature, binary alloys or compounds such as Cu-Ag or Cr O2, respectively. Elemental metals are not stable in the amorphous state.


2021 ◽  
pp. 138442
Author(s):  
Volodymyr M. Hiiuk ◽  
Karl Ridier ◽  
Il'ya A. Gural'skiy ◽  
Alexander A. Golub ◽  
Igor O. Fritsky ◽  
...  

CrystEngComm ◽  
2021 ◽  
Author(s):  
Weihua Wang ◽  
Bing Dai ◽  
Guoyang Shu ◽  
Yang Wang ◽  
Benjian Liu ◽  
...  

Diamond nucleation on iridium (001) substrates was investigated under different bias conditions. High-density epitaxial nucleation can be obtained in a narrow bias window. This paper reports both the typical nucleation...


2013 ◽  
Vol 103 (18) ◽  
pp. 183116 ◽  
Author(s):  
Grzegorz Lupina ◽  
Mindaugas Lukosius ◽  
Julia Kitzmann ◽  
Jarek Dabrowski ◽  
Andre Wolff ◽  
...  

1992 ◽  
Vol 7 (5) ◽  
pp. 1115-1125 ◽  
Author(s):  
P.B. Barna ◽  
A. Csanády ◽  
U. Timmer ◽  
K. Urban

The nucleation and growth of quasicrystalline thin films during sequential vapor deposition of aluminum and manganese on various substrates have been studied at temperatures between 530 and 650 K. The films were analyzed by transmission electron microscopy, electron diffraction, energy dispersive x-ray analysis, replica techniques, and Auger depth profiling. The quasicrystalline phase is identified as icosahedral. It nucleates on the surfaces of the Al films. There is no indication of substantial bulk Mn diffusion. The growth process is governed by diffusion of Al to the quasicrystal surface where it reacts with the incident Mn.


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