Phase Transitions in Langmuir−Blodgett Films of Cadmium Stearate:  Grazing Incidence X-ray Diffraction Studies

Langmuir ◽  
1997 ◽  
Vol 13 (6) ◽  
pp. 1602-1606 ◽  
Author(s):  
J. B. Peng ◽  
G. J. Foran ◽  
G. T. Barnes ◽  
I. R. Gentle
Langmuir ◽  
1998 ◽  
Vol 14 (20) ◽  
pp. 5896-5899 ◽  
Author(s):  
Deborah B. Hammond ◽  
Trevor Rayment ◽  
Damien Dunne ◽  
Philip Hodge ◽  
Ziad Ali-Adib ◽  
...  

1988 ◽  
Vol 27 (Part 1, No. 5) ◽  
pp. 715-720 ◽  
Author(s):  
Koichi Mizushima ◽  
Shun Egusa ◽  
Makoto Azuma

Langmuir ◽  
2002 ◽  
Vol 18 (21) ◽  
pp. 8260-8262 ◽  
Author(s):  
Jeffrey T. Culp ◽  
Mark Davidson ◽  
Randolph S. Duran ◽  
Daniel R. Talham

2004 ◽  
Vol 19 (1) ◽  
pp. 45-48 ◽  
Author(s):  
B. K. Tanner ◽  
T. P. A. Hase ◽  
T. A. Lafford ◽  
M. S. Goorsky

The laboratory implementation of grazing incidence in-plane X-ray diffraction, using an unmodified commercial diffractometer, is described. Low resolution, high intensity measurements are illustrated in the study of the in-plane lattice parameters and texture of a thin polycrystalline ZnO film on glass, the in-plane order in Cd arachidate Langmuir–Blodgett films, and the depth dependence of the lattice parameter in graded Si–Ge epilayers. Use of an asymmetrically cut Ge crystal to compress and monochromate the beam provides a high resolution setting, appropriate to measurement of the in-plane mosaic of mismatched epilayers such as GaN on sapphire.


1991 ◽  
Vol 237 ◽  
Author(s):  
B. K. Tanner ◽  
D. K Bowen ◽  
M. C Petty ◽  
S. Swaminathan ◽  
F. Granfeld

ABSTRACTGrazing incidence X-ray reflectometry has been used to characterize Langmuir-Blodgett films of cadmium arachidate deposited on silicon substrates. The agreement between layer parameters deduced from the interference fringe period and low angle Bragg peak positions was excellent. Good agreement was found between experimental and simulated reflectivity profiles only when interface roughness and a varying molecular layer thickness was included. Inclusion of interface roughness alone results in a substantial enhancement in the intensity of the Bragg peaks. This effect is identified as being equivalent to the reduction in extinction found in classical X-ray diffraction due to crystal imperfections.


1996 ◽  
Vol 284-285 ◽  
pp. 144-146 ◽  
Author(s):  
A Malik ◽  
M.K Durbin ◽  
A.G Richter ◽  
K.G Huang ◽  
P Dutta

1987 ◽  
Vol 26 (Part 1, No. 5) ◽  
pp. 772-773 ◽  
Author(s):  
Koichi Mizushima ◽  
Toshio Nakayama ◽  
Makoto Azuma

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