Superstructures and Correlated Metal Ion Layers in Langmuir−Blodgett Films of Cadmium Soaps Observed with Grazing Incidence X-ray Diffraction

2000 ◽  
Vol 104 (23) ◽  
pp. 5553-5556 ◽  
Author(s):  
J. B. Peng ◽  
G. T. Barnes ◽  
I. R. Gentle ◽  
G. J. Foran
Keyword(s):  
Metal Ion ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Langmuir Blodgett ◽  
Langmuir Blodgett Films

A Grazing Incidence X-ray Diffraction Study of Langmuir−Blodgett Films of Poly(vinylpyridine) Quaternized withn-Docosyl Bromide

Langmuir ◽  
1998 ◽  
Vol 14 (20) ◽  
pp. 5896-5899 ◽  
Author(s):  
Deborah B. Hammond ◽  
Trevor Rayment ◽  
Damien Dunne ◽  
Philip Hodge ◽  
Ziad Ali-Adib ◽  
...  
Keyword(s):  
Diffraction Study ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Langmuir Blodgett ◽  
Langmuir Blodgett Films

Structural Characterization of Metal Phosphonate Langmuir−Blodgett Films by Grazing Incidence X-ray Diffraction

Langmuir ◽  
2002 ◽  
Vol 18 (21) ◽  
pp. 8260-8262 ◽  
Author(s):  
Jeffrey T. Culp ◽  
Mark Davidson ◽  
Randolph S. Duran ◽  
Daniel R. Talham
Keyword(s):  
Structural Characterization ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Langmuir Blodgett ◽  
Metal Phosphonate ◽  
Langmuir Blodgett Films

Grazing incidence in-plane X-ray diffraction in the laboratory

2004 ◽  
Vol 19 (1) ◽  
pp. 45-48 ◽  
Author(s):  
B. K. Tanner ◽  
T. P. A. Hase ◽  
T. A. Lafford ◽  
M. S. Goorsky
Keyword(s):  
High Resolution ◽  
Grazing Incidence ◽  
Lattice Parameter ◽  
X Ray Diffraction ◽  
Zno Film ◽  
X Ray ◽  
Langmuir Blodgett ◽  
Intensity Measurements ◽  
Langmuir Blodgett Films ◽  
Thin Polycrystalline

The laboratory implementation of grazing incidence in-plane X-ray diffraction, using an unmodified commercial diffractometer, is described. Low resolution, high intensity measurements are illustrated in the study of the in-plane lattice parameters and texture of a thin polycrystalline ZnO film on glass, the in-plane order in Cd arachidate Langmuir–Blodgett films, and the depth dependence of the lattice parameter in graded Si–Ge epilayers. Use of an asymmetrically cut Ge crystal to compress and monochromate the beam provides a high resolution setting, appropriate to measurement of the in-plane mosaic of mismatched epilayers such as GaN on sapphire.

Grazing Incidence X-Ray Reflectometry Studies of Cadmium Arachidate Langmuir-Blodgett Films

1991 ◽  
Vol 237 ◽  
Author(s):  
B. K. Tanner ◽  
D. K Bowen ◽  
M. C Petty ◽  
S. Swaminathan ◽  
F. Granfeld
Keyword(s):  
Molecular Layer ◽  
Grazing Incidence ◽  
Interface Roughness ◽  
Silicon Substrates ◽  
X Ray Diffraction ◽  
X Ray ◽  
Langmuir Blodgett ◽  
Crystal Imperfections ◽  
Langmuir Blodgett Films ◽  
Good Agreement

ABSTRACTGrazing incidence X-ray reflectometry has been used to characterize Langmuir-Blodgett films of cadmium arachidate deposited on silicon substrates. The agreement between layer parameters deduced from the interference fringe period and low angle Bragg peak positions was excellent. Good agreement was found between experimental and simulated reflectivity profiles only when interface roughness and a varying molecular layer thickness was included. Inclusion of interface roughness alone results in a substantial enhancement in the intensity of the Bragg peaks. This effect is identified as being equivalent to the reduction in extinction found in classical X-ray diffraction due to crystal imperfections.

Unusual X-Ray Diffraction Vector Shift Observed in Heterogeneous Langmuir-Blodgett Multilayer Films

1992 ◽  
Vol 247 ◽  
Author(s):  
Yoshio Nogami ◽  
Kazuyoshi Ogasawara ◽  
Shigeki Takeuchi ◽  
Takehiko Ishiguro ◽  
Kazumasa Ohsumi ◽  
...  
Keyword(s):  
Diffraction Method ◽  
X Ray Diffraction ◽  
Diffraction Vector ◽  
X Ray ◽  
Langmuir Blodgett ◽  
Alkyl Chains ◽  
Oscillatory Structure ◽  
Langmuir Blodgett Films ◽  
Diffraction Patterns ◽  
Vector Shift

ABSTRACTStacking of heterogeneous Langmuir-Blodgett films was studied by high resolution X-ray diffraction method using synchrotron radiation (SR) source. The diffraction patterns of the heterogeneous films formed with alternately deposited Cd salts of fatty acids with different length of alkyl chains exhibit anomalous oscillatory structure in diffraction vector.

X-Ray Reflectometry from Semiconductor Surfaces and Interfaces

1990 ◽  
Vol 208 ◽  
Author(s):  
Brian K Tanner ◽  
Simon J Miles ◽  
D Keith Bowen ◽  
Linda Hart ◽  
Neil Loxley
Keyword(s):  
Surface Damage ◽  
Grazing Incidence ◽  
High Energy ◽  
Thin Layers ◽  
Energy Dispersive ◽  
X Ray ◽  
Langmuir Blodgett ◽  
Surfaces And Interfaces ◽  
Langmuir Blodgett Films ◽  
Preliminary Study

ABSTRACTX-ray reflectance measurements at grazing incidence provide non-destructively a measure of the thickness of thin layers, the electron density as a function of depth, and interface and surface roughness. We show that the effect of roughness at a buried interface is only to reduce the visibility of the interference fringes, whereas roughness at the top surface leads also to an overall increase in the rate of fall of intensity with angle (or energy). These two contributions can then be readily distinguished.Most work has been performed in monochromatic angular dispersive mode. We present here a preliminary study of the application of the high-energy, fixed-angle, energy dispersive mode for the study of thin epitaxial layers, Langmuir-Blodgett films, surface damage on silicon chemi-sol polished wafers and ion implanted silicon and aluminium. Data has been analysed using the theory of Parratt, which we have adapted for use in the energy dispersive method.

Sign in / Sign up

Export Citation Format

Share Document