Effect of Tip Size on Force Measurement in Atomic Force Microscopy

Langmuir ◽  
2008 ◽  
Vol 24 (6) ◽  
pp. 2271-2273 ◽  
Author(s):  
Leonard T. W. Lim ◽  
Andrew T. S. Wee ◽  
Sean J. O'Shea
Keyword(s):  
Atomic Force Microscopy ◽  
Force Measurement ◽  
Force Microscopy ◽  
Atomic Force

The Study on the Ultrasonic Nanomachining of Au/Ti Thin Film by Atomic Force Microscopy

2014 ◽  
Vol 627 ◽  
pp. 35-39
Author(s):  
Jen Ching Huang ◽  
Ho Chang ◽  
Yong Chin You ◽  
Hui Ti Ling
Keyword(s):  
Thin Film ◽  
Atomic Force Microscopy ◽  
Quartz Crystal ◽  
Normal Force ◽  
Force Measurement ◽  
Great Influence ◽  
Measurement Model ◽  
Cutting Depth ◽  
Force Microscopy ◽  
Atomic Force

This study focused on the ultrasonic nanomachining by atomic force microscopy (AFM) to understand the phenomena of the ultrasonic nanomachining. The workpiece is an Au/Ti thin film and coated on the quartz crystal resonator (QCR). The ultrasound vibration of workpiece is carried out by used the Quartz crystal microbalance (QCM). And a normal force measurement model was built by force curve measurements in ultrasound vibration environment. The influence of different experimental parameters can be studied such as normal force and repeat number on the cutting depth and chip stacking. After the experiments, it can be found that the ultrasonic nanomachining by AFM is possessed great influence on the cutting depth.

Robust high-resolution imaging and quantitative force measurement with tuned-oscillator atomic force microscopy

2016 ◽  
Vol 27 (6) ◽  
pp. 065703 ◽  
Author(s):  
Omur E Dagdeviren ◽  
Jan Götzen ◽  
Hendrik Hölscher ◽  
Eric I Altman ◽  
Udo D Schwarz
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Force Measurement ◽  
High Resolution Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Resolution Imaging

Direct force measurement between cucurbit[6]uril and spermine using atomic force microscopy

Tetrahedron ◽  
2008 ◽  
Vol 64 (36) ◽  
pp. 8389-8393 ◽  
Author(s):  
Jeonghan Kim ◽  
Youngkook Kim ◽  
Kangkyun Baek ◽  
Young Ho Ko ◽  
Dongwoo Kim ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Measurement ◽  
Force Microscopy ◽  
Atomic Force
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