Colloidal drug probe: Method development and validation for adhesion force measurement using Atomic Force Microscopy

2014 ◽  
Vol 25 (4) ◽  
pp. 1240-1248 ◽  
Author(s):  
Nazrul Islam ◽  
Rinku A Tuli ◽  
Graeme A George ◽  
Tim R Dargaville
Keyword(s):  
Atomic Force Microscopy ◽  
Method Development ◽  
Adhesion Force ◽  
Force Measurement ◽  
Probe Method ◽  
Force Microscopy ◽  
Atomic Force ◽  
Method Development And Validation ◽  
Development And Validation

Thermo-Mechanical Effect on Nanostructure Formation Using Atomic Force Microscopy

2006 ◽  
Vol 505-507 ◽  
pp. 151-156
Author(s):  
Jin Ray Hsu ◽  
Chih Chung Hsiao ◽  
Cheng Kuo Sung ◽  
Chaug Liang Hsu
Keyword(s):  
Atomic Force Microscopy ◽  
Contact Area ◽  
Adhesion Force ◽  
Force Measurement ◽  
Mechanical Effect ◽  
Force Microscopy ◽  
Nanostructure Formation ◽  
Atomic Force ◽  
Higher Temperature ◽  
Level Process

Molecular dynamics (MD) simulation and the experiment of adhesion force measurement were introduced to study the nanostructure formation process in the atomic force microscopy. The atomic level process of the nanostructure formation and the thermo-mechanical effect caused by the factors of the contact area, the adhesion force, and the temperature were clearly shown and discussed. The size of the forming nanostructures was found to be positively related to the contact area and temperature, but the adhesion force would decrease as the temperature increase. In the case of higher temperature with smaller adhesion force, however, the larger-size nanostructure could still be made.

Adhesion force measurement of a DPI size pharmaceutical particle by colloid probe atomic force microscopy

2004 ◽  
Vol 141 (3) ◽  
pp. 262-269 ◽  
Author(s):  
M Tsukada ◽  
R Irie ◽  
Y Yonemochi ◽  
R Noda ◽  
H Kamiya ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Adhesion Force ◽  
Force Measurement ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Shale adhesion force measurements via atomic force microscopy

2021 ◽  
Vol 76 ◽  
pp. 73
Author(s):  
Nikolai Mitiurev ◽  
Michael Verrall ◽  
Svetlana Shilobreeva ◽  
Alireza Keshavarz ◽  
Stefan Iglauer
Keyword(s):  
Atomic Force Microscopy ◽  
Adhesion Force ◽  
Force Measurement ◽  
Sample Surface ◽  
Wettability Alteration ◽  
Rock Surface ◽  
United States Bureau ◽  
Adhesion Forces ◽  
Force Microscopy ◽  
Atomic Force

Wettability of sedimentary rock surface is an essential parameter that defines oil recovery and production rates of a reservoir. The discovery of wettability alteration in reservoirs, as well as complications that occur in analysis of heterogeneous sample, such as shale, for instance, have prompted scientists to look for the methods of wettability assessment at nanoscale. At the same time, bulk techniques, which are commonly applied, such as USBM (United States Bureau of Mines) or Amott tests, are not sensitive enough in cases with mixed wettability of rocks as they provide average wettability values of a core plug. Atomic Force Microscopy (AFM) has been identified as one of the methods that allow for measurement of adhesion forces between cantilever and sample surface in an exact location at nanoscale. These adhesion forces can be used to estimate wettability locally. Current research, however, shows that the correlation is not trivial. Moreover, adhesion force measurement via AFM has not been used extensively in studies with geological samples yet. In this study, the adhesion force values of the cantilever tip interaction with quartz inclusion on the shale sample surface, have been measured using the AFM technique. The adhesion force measured in this particular case was equal to the capillary force of water meniscus, formed between the sample surface and the cantilever tip. Experiments were conducted with a SiconG cantilever with (tip radius of 5 nm). The adhesion forces between quartz grain and cantilever tip were equal to 56.5 ± 5 nN. Assuming the surface of interaction to be half spherical, the adhesion force per area was 0.36 ± 0.03 nN/nm2. These measurements and results acquired at nano-scale will thus create a path towards much higher accuracy-wettability measurements and consequently better reservoir-scale predictions and improved underground operations.

Characterization of English ivy (Hedera helix) adhesion force and imaging using atomic force microscopy

2010 ◽  
Vol 13 (3) ◽  
pp. 1029-1037 ◽  
Author(s):  
Lijin Xia ◽  
Scott C. Lenaghan ◽  
Mingjun Zhang ◽  
Yu Wu ◽  
Xiaopeng Zhao ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Adhesion Force ◽  
Hedera Helix ◽  
Force Microscopy ◽  
Atomic Force ◽  
English Ivy

scholarly journals Adhesion force mapping on wood by atomic force microscopy: influence of surface roughness and tip geometry

2016 ◽  
Vol 3 (10) ◽  
pp. 160248 ◽  
Author(s):  
X. Jin ◽  
B. Kasal
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Wood Surface ◽  
Adhesion Force ◽  
Data Interpretation ◽  
Natural Fibre ◽  
Force Distribution ◽  
Adhesion Forces ◽  
Force Microscopy ◽  
Atomic Force

This study attempts to address the interpretation of atomic force microscopy (AFM) adhesion force measurements conducted on the heterogeneous rough surface of wood and natural fibre materials. The influences of wood surface roughness, tip geometry and wear on the adhesion force distribution are examined by cyclic measurements conducted on wood surface under dry inert conditions. It was found that both the variation of tip and surface roughness of wood can widen the distribution of adhesion forces, which are essential for data interpretation. When a common Si AFM tip with nanometre size is used, the influence of tip wear can be significant. Therefore, control experiments should take the sequence of measurements into consideration, e.g. repeated experiments with used tip. In comparison, colloidal tips provide highly reproducible results. Similar average values but different distributions are shown for the adhesion measured on two major components of wood surface (cell wall and lumen). Evidence supports the hypothesis that the difference of the adhesion force distribution on these two locations was mainly induced by their surface roughness.

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