Formation of Dielectric Layers and Charge Regulation in Protein Adsorption at Biomimetic Interfaces

Langmuir ◽  
2012 ◽  
Vol 28 (3) ◽  
pp. 1804-1815 ◽  
Author(s):  
Rune A. Hartvig ◽  
Marco van de Weert ◽  
Jesper Østergaard ◽  
Lene Jorgensen ◽  
Henrik Jensen
Keyword(s):  
Protein Adsorption ◽  
Charge Regulation ◽  
Dielectric Layers ◽  
Biomimetic Interfaces

Protein Adsorption at Charged Surfaces: The Role of Electrostatic Interactions and Interfacial Charge Regulation

Langmuir ◽  
2011 ◽  
Vol 27 (6) ◽  
pp. 2634-2643 ◽  
Author(s):  
Rune A. Hartvig ◽  
Marco van de Weert ◽  
Jesper Østergaard ◽  
Lene Jorgensen ◽  
Henrik Jensen
Keyword(s):  
Protein Adsorption ◽  
Electrostatic Interactions ◽  
Charge Regulation ◽  
Charged Surfaces ◽  
Interfacial Charge

Enhanced Protein Adsorption Due to Charge Regulation

Langmuir ◽  
2005 ◽  
Vol 21 (18) ◽  
pp. 8385-8388 ◽  
Author(s):  
Mikael Lund ◽  
Torbjörn Åkesson ◽  
Bo Jönsson
Keyword(s):  
Protein Adsorption ◽  
Charge Regulation

scholarly journals Electrostatically Driven Protein Adsorption: Charge Patches versus Charge Regulation

Langmuir ◽  
2018 ◽  
Vol 34 (51) ◽  
pp. 15727-15738 ◽  
Author(s):  
F. M. Boubeta ◽  
G. J. A. A. Soler-Illia ◽  
M. Tagliazucchi
Keyword(s):  
Protein Adsorption ◽  
Charge Regulation

Precipitation in silicon: Microanalysis

1988 ◽  
Vol 46 ◽  
pp. 474-475
Author(s):  
R.W. Carpenter
Keyword(s):  
Transition Metals ◽  
Spatial Resolution ◽  
Thin Foil ◽  
Precipitation Reaction ◽  
High Current ◽  
Reaction Products ◽  
Carbon And Nitrogen ◽  
Dielectric Layers ◽  
Precipitation Processes ◽  
Areas Of Interest

Interest in precipitation processes in silicon appears to be centered on transition metals (for intrinsic and extrinsic gettering), and oxygen and carbon in thermally aged materials, and on oxygen, carbon, and nitrogen in ion implanted materials to form buried dielectric layers. A steadily increasing number of applications of microanalysis to these problems are appearing. but still far less than the number of imaging/diffraction investigations. Microanalysis applications appear to be paced by instrumentation development. The precipitation reaction products are small and the presence of carbon is often an important consideration. Small high current probes are important and cryogenic specimen holders are required for consistent suppression of contamination buildup on specimen areas of interest. Focussed probes useful for microanalysis should be in the range of 0.1 to 1nA, and estimates of spatial resolution to be expected for thin foil specimens can be made from the curves shown in Fig. 1.

The effect of an aluminum heat-sink layer on the laser-induced amorphization of SiOx/TeGeSn/SiOx phase-change recording films

1989 ◽  
Vol 47 ◽  
pp. 574-575
Author(s):  
Matthew R. Libera ◽  
Martin Chen
Keyword(s):  
Thin Film ◽  
Phase Change ◽  
Heat Sink ◽  
Multilayer Film ◽  
Glassy Phase ◽  
Film Structure ◽  
Glass Forming ◽  
Active Storage ◽  
Dielectric Layers ◽  
Amorphous States

Phase-change erasable optical storage is based on the ability to switch a micron-sized region of a thin film between the crystalline and amorphous states using a diffraction-limited laser as a heat source. A bit of information can be represented as an amorphous spot on a crystalline background, and the two states can be optically identified by their different reflectivities. In a typical multilayer thin-film structure the active (storage) layer is sandwiched between one or more dielectric layers. The dielectric layers provide physical containment and act as a heat sink. A viable phase-change medium must be able to quench to the glassy phase after melting, and this requires proper tailoring of the thermal properties of the multilayer film. The present research studies one particular multilayer structure and shows the effect of an additional aluminum layer on the glass-forming ability.

Precision Xe Plasma FIB Delayering for Physical Failure Analysis of Sub-20 nm Microprocessor Devices

2017 ◽  
Author(s):  
D. Zudhistira ◽  
V. Viswanathan ◽  
V. Narang ◽  
J.M. Chin ◽  
S. Sharang ◽  
...  
Keyword(s):  
Failure Analysis ◽  
Dielectric Films ◽  
Planar Surface ◽  
Chemical Methods ◽  
Root Cause ◽  
Essential Step ◽  
Dielectric Layers ◽  
Wet Chemical ◽  
20 Nm ◽  
Low K

Abstract Deprocessing is an essential step in the physical failure analysis of ICs. Typically, this is accomplished by techniques such as wet chemical methods, RIE, and mechanical manual polishing. Manual polishing suffers from highly non-uniform delayering particularly for sub 20nm technologies due to aggressive back-end-of-line scaling and porous ultra low-k dielectric films. Recently gas assisted Xe plasma FIB has demonstrated uniform delayering of the metal and dielectric layers, achieving a planar surface of heterogeneous materials. In this paper, the successful application of this technique to delayer sub-20 nm microprocessor chips with real defects to root cause the failure is presented.

Effect of Sintering Processes on Surface Properties and Protein Adsorption of Hydroxyapatite Ceramic Particles

2010 ◽  
Vol 25 (7) ◽  
pp. 770-774 ◽  
Author(s):  
Hui-Jie ZHANG ◽  
Xiang-Dong ZHU ◽  
Xin-Long WANG ◽  
Hong-Song FAN ◽  
Xing-Dong ZHANG
Keyword(s):  
Protein Adsorption ◽  
Surface Properties ◽  
Hydroxyapatite Ceramic ◽  
Ceramic Particles ◽  
Sintering Processes

Controlled radical polymerization of hydrophilic and zwitterionic brush-like polymers from silk fibroin surfaces

2020 ◽  
Vol 8 (45) ◽  
pp. 10392-10406
Author(s):  
Danielle L. Heichel ◽  
Ngoc Chau H. Vy ◽  
Shawn P. Ward ◽  
Douglas H. Adamson ◽  
Kelly A. Burke
Keyword(s):  
Protein Adsorption ◽  
Radical Polymerization ◽  
Silk Fibroin ◽  
Cell Attachment ◽  
Controlled Radical Polymerization

Silk fibroin films were modified with zwitterionic and hydrophilic brush-like polymers via surface-initiated ATRP, resulting in surfaces that reduced protein adsorption and cell attachment.

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