Self-Supported Particle-Track-Etched Polycarbonate Membranes as Templates for Cylindrical Polypyrrole Nanotubes and Nanowires:  An X-ray Scattering and Scanning Force Microscopy Investigation

Langmuir ◽  
2005 ◽  
Vol 21 (25) ◽  
pp. 11987-11993 ◽  
Author(s):  
N. Hermsdorf ◽  
M. Stamm ◽  
S. Förster ◽  
S. Cunis ◽  
S. S. Funari ◽  
...  
Keyword(s):  
Scanning Force Microscopy ◽  
Particle Track ◽  
X Ray ◽  
Force Microscopy ◽  
Polypyrrole Nanotubes ◽  
X Ray Scattering ◽  
Microscopy Investigation ◽  
Polycarbonate Membranes ◽  
Scanning Force ◽  
Ray Scattering

In situ X-ray Scattering Study of the Formation of Au Nano Crystals During Thermal Annealing

2007 ◽  
Vol 1027 ◽  
Author(s):  
Do Young Noh ◽  
Ki-Hyun Ryu ◽  
Hyon Chol Kang
Keyword(s):  
Thermal Annealing ◽  
Bragg Reflection ◽  
Ex Situ ◽  
X Ray ◽  
Force Microscopy ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Au Thin Films ◽  
Ray Scattering

AbstractThe transformation of Au thin films grown on sapphire (0001) substrates into nano crystals during thermal annealing was investigated by in situ synchrotron x-ray scattering and ex situ atomic force microscopy (AFM). By monitoring the Au(111) Bragg reflection and the low Q reflectivity and comparing them with ex situ AFM images, we found that polygonal-shape holes were nucleated and grow initially. As the holes grow larger and contact each other, their boundary turns into Au nano crystals. The Au nano crystals have a well-defined (111) flat top surface and facets in the in-plane direction.

Ion track etching of polycarbonate membranes monitored by in situ small angle X-ray scattering

2021 ◽  
Author(s):  
Alexander Kiy ◽  
Christian Notthoff ◽  
Shankar Dutt ◽  
Mark Grigg ◽  
Andrea Hadley ◽  
...  
Keyword(s):  
High Precision ◽  
Small Angle ◽  
Selective Dissolution ◽  
X Ray ◽  
Ion Tracks ◽  
X Ray Scattering ◽  
Track Etching ◽  
Polycarbonate Membranes ◽  
Ray Scattering

In situ small angle X-ray scattering (SAXS) measurements of ion track etching of polycarbonate foils are used to directly monitor the selective dissolution of ion tracks with high precision, including...

scholarly journals Magnetic reconfiguration of MnAs∕GaAs(001) observed by magnetic force microscopy and resonant soft x-ray scattering

2006 ◽  
Vol 100 (8) ◽  
pp. 083906 ◽  
Author(s):  
L. N. Coelho ◽  
B. R. A. Neves ◽  
R. Magalhães-Paniago ◽  
F. C. Vicentin ◽  
H. Westfahl ◽  
...  
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
X Ray ◽  
Force Microscopy ◽  
X Ray Scattering ◽  
Ray Scattering

Comparative study of the roughness of optical surfaces and thin films by use of x-ray scattering and atomic force microscopy

1999 ◽  
Vol 38 (4) ◽  
pp. 684 ◽  
Author(s):  
Victor E. Asadchikov ◽  
Angela Duparré ◽  
Stefan Jakobs ◽  
Albert Yu. Karabekov ◽  
Igor V. Kozhevnikov ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Comparative Study ◽  
X Ray ◽  
Force Microscopy ◽  
Optical Surfaces ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Ray Scattering

The surface roughness investigation by the atomic force microscopy, x-ray scattering, and light scattering

2006 ◽  
Author(s):  
M. L. Zanaveskin ◽  
Yu. V. Grishchenko ◽  
A. L. Tolstikhina ◽  
V. E. Asadchikov ◽  
B. S. Roshchin ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Light Scattering ◽  
X Ray ◽  
Force Microscopy ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Ray Scattering

Supported Particle Track Etched Polyimide Membranes:  A Grazing Incidence Small-Angle X-ray Scattering Study

Langmuir ◽  
2004 ◽  
Vol 20 (23) ◽  
pp. 10303-10310 ◽  
Author(s):  
N. Hermsdorf ◽  
K. Sahre ◽  
P. Volodin ◽  
M. Stamm ◽  
K. J. Eichhorn ◽  
...  
Keyword(s):  
Small Angle ◽  
Grazing Incidence ◽  
Particle Track ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Study ◽  
Polyimide Membranes ◽  
Ray Scattering
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