Nanometer Scale Surface Properties of Supported Lipid Bilayers Measured with Hydrophobic and Hydrophilic Atomic Force Microscope Probes†

Langmuir ◽  
2003 ◽  
Vol 19 (5) ◽  
pp. 1899-1907 ◽  
Author(s):  
James Schneider ◽  
William Barger ◽  
Gil U. Lee
Keyword(s):  
Atomic Force Microscope ◽  
Surface Properties ◽  
Lipid Bilayers ◽  
Supported Lipid Bilayers ◽  
Nanometer Scale ◽  
Atomic Force ◽  
Scale Surface

In Situ Atomic Force Microscope Imaging of Supported Lipid Bilayers

2001 ◽  
Vol 2 (2) ◽  
pp. 105-108 ◽  
Author(s):  
Thomas Kaasgaard ◽  
Chad Leidy ◽  
John Hjort Ipsen ◽  
Ole G. Mouritsen ◽  
Kent Jørgensen
Keyword(s):  
Atomic Force Microscope ◽  
Lipid Bilayers ◽  
Supported Lipid Bilayers ◽  
Atomic Force ◽  
Microscope Imaging

scholarly journals Pulling lipid tubes from supported bilayers unveils the underlying substrate contribution to the membrane mechanics

Nanoscale ◽  
2018 ◽  
Vol 10 (30) ◽  
pp. 14763-14770 ◽  
Author(s):  
Berta Gumí-Audenis ◽  
Luca Costa ◽  
Lidia Ferrer-Tasies ◽  
Imma Ratera ◽  
Nora Ventosa ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Lipid Bilayers ◽  
Supported Lipid Bilayers ◽  
Membrane Mechanics ◽  
Supported Bilayers ◽  
Atomic Force ◽  
Underlying Substrate

Pulling lipid tubes with an atomic force microscope from supported lipid bilayers explores the substrate contribution to the membrane nanomechanics.

Single Asperity Atomic Force Microscope Studies of the CMP of Silicate Glasses

2005 ◽  
Author(s):  
Stephen C. Langford ◽  
Forrest Stevens ◽  
J. Thomas Dickinson
Keyword(s):  
Atomic Force Microscope ◽  
Mechanical Stress ◽  
Material Removal ◽  
Surface Modifications ◽  
Nanometer Scale ◽  
Simultaneous Application ◽  
Single Asperity ◽  
Atomic Force ◽  
Chemical Agents ◽  
Scale Surface

The Atomic Force Microscope (AFM) allows one to examine the effects of applying highly localized stress to a surface. In the presence of solutions, tribochemical wear can be investigated. We present results of fundamental studies of the simultaneous application of chemical agents and mechanical stress involving a model single asperity and a solid surface. We show the consequences of combining highly localized mechanical stress (due to contact with the AFM tip) and exposure to aqueous solutions of known pH. The experiment simulates many features of a single particle-substrate-slurry interaction in CMP. We show that linear scans and rastered scans display significantly different material removal rates. Quantitative models are presented to explain the observed nanometer-scale surface modifications. This work complements recent observations of tip-induced wear and growth in a number of inorganic surfaces in aqueous solution.

scholarly journals Using the Atomic Force Microscope to Study the Interaction between Two Solid Supported Lipid Bilayers and the Influence of Synapsin I

2004 ◽  
Vol 87 (4) ◽  
pp. 2446-2455 ◽  
Author(s):  
Ioana Pera ◽  
Rüdiger Stark ◽  
Michael Kappl ◽  
Hans-Jürgen Butt ◽  
Fabio Benfenati
Keyword(s):  
Atomic Force Microscope ◽  
Lipid Bilayers ◽  
Supported Lipid Bilayers ◽  
Synapsin I ◽  
Atomic Force

A Study of the Photoelectric Effect Caused by a Laser Beam Used in a Beam Bounce Technique in a C-AFM System

2008 ◽  
Author(s):  
Hung-Sung Lin ◽  
Mong-Sheng Wu
Keyword(s):  
Laser Beam ◽  
Failure Analysis ◽  
Atomic Force Microscope ◽  
Photoelectric Effect ◽  
Scanning Probe ◽  
Nanometer Scale ◽  
Electrical Characteristics ◽  
Atomic Force ◽  
Probe Microscope ◽  
Probe Head

Abstract The use of a scanning probe microscope (SPM), such as a conductive atomic force microscope (C-AFM) has been widely reported as a method of failure analysis in nanometer scale science and technology [1-6]. A beam bounce technique is usually used to enable the probe head to measure extremely small movements of the cantilever as it is moved across the surface of the sample. However, the laser beam used for a beam bounce also gives rise to the photoelectric effect while we are measuring the electrical characteristics of a device, such as a pn junction. In this paper, the photocurrent for a device caused by photon illumination was quantitatively evaluated. In addition, this paper also presents an example of an application of the C-AFM as a tool for the failure analysis of trap defects by taking advantage of the photoelectric effect.

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