Experimental Determination of Spring Constants in Atomic Force Microscopy

Tim Senden; William Ducker

doi:10.1021/la00016a600

Experimental Determination of Spring Constants in Atomic Force Microscopy

Langmuir ◽

10.1021/la00016a600 ◽

1994 ◽

Vol 10 (4) ◽

pp. 1003-1004 ◽

Cited By ~ 152

Author(s):

Tim Senden ◽

William Ducker

Keyword(s):

Atomic Force Microscopy ◽

Experimental Determination ◽

Force Microscopy ◽

Atomic Force ◽

Spring Constants

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Experimental determination of the mechanical impedance of atomic force microscopy cantilevers in fluids up to 70 kHz

Journal of Applied Physics ◽

10.1063/1.1287522 ◽

2000 ◽

Vol 88 (5) ◽

pp. 2912-2920 ◽

Cited By ~ 22

Author(s):

Marc P. Scherer ◽

Gerhard Frank ◽

Anthony W. Gummer

Keyword(s):

Atomic Force Microscopy ◽

Experimental Determination ◽

Mechanical Impedance ◽

Force Microscopy ◽

Atomic Force

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Experimental determination of the diameter-dependent wettability of carbon nanotubes as studied using atomic force microscopy

Physical Chemistry Chemical Physics ◽

10.1039/c8cp05387a ◽

2018 ◽

Vol 20 (42) ◽

pp. 26979-26985

Author(s):

Konan Imadate ◽

Kaori Hirahara

Keyword(s):

Carbon Nanotubes ◽

Atomic Force Microscopy ◽

Experimental Determination ◽

Force Microscopy ◽

Atomic Force

The diameter-dependent wettability of carbon nanotubes was shown for diameters <10 nm by AFM measurements.

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Determination of near-surface forces in optical polishing using atomic force microscopy

Nanotechnology ◽

10.1088/0957-4484/5/2/002 ◽

1994 ◽

Vol 5 (2) ◽

pp. 70-79 ◽

Cited By ~ 7

Author(s):

M J Cumbo ◽

S D Jacobs

Keyword(s):

Atomic Force Microscopy ◽

Surface Forces ◽

Near Surface ◽

Force Microscopy ◽

Atomic Force ◽

Optical Polishing

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Determination of spatial resolution in atomic-force-microscopy-based electrical characterization techniques using quantum well structures

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.1835317 ◽

2005 ◽

Vol 23 (1) ◽

pp. 61 ◽

Cited By ~ 10

Author(s):

O. Douhéret ◽

S. Bonsels ◽

S. Anand

Keyword(s):

Atomic Force Microscopy ◽

Quantum Well ◽

Spatial Resolution ◽

Electrical Characterization ◽

Quantum Well Structures ◽

Force Microscopy ◽

Characterization Techniques ◽

Atomic Force

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Determination of electrostatic force and its characteristics based on phase difference by amplitude modulation atomic force microscopy

Nanoscale Research Letters ◽

10.1186/s11671-016-1765-2 ◽

2016 ◽

Vol 11 (1) ◽

Cited By ~ 2

Author(s):

Kesheng Wang ◽

Jia Cheng ◽

Shiji Yao ◽

Yijia Lu ◽

Linhong Ji ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Phase Difference ◽

Amplitude Modulation ◽

Electrostatic Force ◽

Force Microscopy ◽

Atomic Force

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Determination of the surface area of annealed continuous gold film and pyrex glass in situ by the BET adsorption isotherm and ex situ by Atomic Force Microscopy in air

Applied Surface Science ◽

10.1016/s0169-4332(98)00297-9 ◽

1998 ◽

Vol 135 (1-4) ◽

pp. 8-14 ◽

Cited By ~ 5

Author(s):

L Stobiński ◽

L Zommer

Keyword(s):

Atomic Force Microscopy ◽

Adsorption Isotherm ◽

Surface Area ◽

Gold Film ◽

Ex Situ ◽

Pyrex Glass ◽

Force Microscopy ◽

Atomic Force

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Determination of solid surface tension at the nano-scale using atomic force microscopy

Contact Angle, Wettability and Adhesion, Volume 4 ◽

10.1201/b12166-17 ◽

2006 ◽

pp. 249-276

Keyword(s):

Surface Tension ◽

Atomic Force Microscopy ◽

Solid Surface ◽

Force Microscopy ◽

Nano Scale ◽

Atomic Force ◽

Solid Surface Tension

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Determination of Microdomain Size in Langmuir-Blodgett Films of Binary Mixtures by IR Spectroscopy and Atomic Force Microscopy

Progress in Fourier Transform Spectroscopy ◽

10.1007/978-3-7091-6840-0_177 ◽

1997 ◽

pp. 683-685

Author(s):

Suci Widayati ◽

Richard A. Dluhy

Keyword(s):

Atomic Force Microscopy ◽

Ir Spectroscopy ◽

Binary Mixtures ◽

Force Microscopy ◽

Langmuir Blodgett ◽

Atomic Force ◽

Langmuir Blodgett Films

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Determination of Punica granatum L. Carpellary membrane elastic properties using atomic force microscopy

Recent Advances in Multidisciplinary Applied Physics ◽

10.1016/b978-008044648-6/50020-3 ◽

2005 ◽

pp. 119-125

Author(s):

M MILLAN ◽

M GASQUE ◽

F GARCIADIEGO ◽

J CURIEL ◽

G RUIZ

Keyword(s):

Atomic Force Microscopy ◽

Elastic Properties ◽

Punica Granatum ◽

Force Microscopy ◽

Atomic Force ◽

Punica Granatum L

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Dynamic spring constants for higher flexural modes of cantilever plates with applications to atomic force microscopy

Ultramicroscopy ◽

10.1016/j.ultramic.2010.02.008 ◽

2010 ◽

Vol 110 (7) ◽

pp. 801-806 ◽

Cited By ~ 15

Author(s):

Georg Hähner

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Spring Constants

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