Spectroscopic Characterization of Inorganic Host:Organic Dopant Films Fabricated via Laser-Assisted Molecular Beam Deposition

1996 ◽  
Vol 100 (25) ◽  
pp. 10707-10709 ◽  
Author(s):  
R. L. DeLeon ◽  
W. M. K. P. Wijekoon ◽  
U. Narang ◽  
M. L. Hall ◽  
P. N. Prasad ◽  
...  
Keyword(s):  
Molecular Beam ◽  
Spectroscopic Characterization ◽  
Molecular Beam Deposition ◽  
Beam Deposition

scholarly journals Synthesis, spectroscopic characterization and thermogravimetric analysis of two series of substituted (metallo)tetraphenylporphyrins

2017 ◽  
Vol 8 ◽  
pp. 1191-1204 ◽  
Author(s):  
Rasha K Al-Shewiki ◽  
Carola Mende ◽  
Roy Buschbeck ◽  
Pablo F Siles ◽  
Oliver G Schmidt ◽  
...  
Keyword(s):  
Thermogravimetric Analysis ◽  
Molecular Beam ◽  
Elevated Temperatures ◽  
Oxalyl Chloride ◽  
Spectroscopic Characterization ◽  
Subsequent Treatment ◽  
Ionization Mass ◽  
Molecular Beam Deposition ◽  
Vis Spectroscopy ◽  
Beam Deposition

Subsequent treatment of H2TPP(CO2H)4 (tetra(p-carboxylic acid phenyl)porphyrin, 1) with an excess of oxalyl chloride and HNR2 afforded H2TPP(C(O)NR2)4 (R = Me, 2; iPr, 3) with yields exceeding 80%. The porphyrins 2 and 3 could be converted to the corresponding metalloporphyrins MTPP(C(O)NR2)4 (R = Me/iPr for M = Zn (2a, 3a); Cu (2b, 3b); Ni (2c, 3c); Co (2d, 3d)) by the addition of 3 equiv of anhydrous MCl2 (M = Zn, Cu, Ni, Co) to dimethylformamide solutions of 2 and 3 at elevated temperatures. Metalloporphyrins 2a–d and 3a–d were obtained in yields exceeding 60% and have been, as well as 2 and 3, characterized by elemental analysis, electrospray ionization mass spectrometry (ESIMS) and IR and UV–vis spectroscopy. Porphyrins 2, 2a–d and 3, 3a–d are not suitable for organic molecular beam deposition (OMBD), which is attributed to their comparatively low thermal stability as determined by thermogravimetric analysis (TG) of selected representatives.

Structural Characterization of Fullerene thin Films Fabricated by Organic Molecular Beam Deposition

1994 ◽  
Vol 359 ◽  
Author(s):  
Kiyoshi Yase ◽  
Takuya Saraya ◽  
Kazuhiro Kudo
Keyword(s):  
Molecular Beam ◽  
Substrate Surface ◽  
Alkali Halides ◽  
Thin Solid Films ◽  
Solid Films ◽  
Molecular Beam Deposition ◽  
Temperature Controlled ◽  
Beam Deposition ◽  
Deposition Conditions

ABSTRACTFullerene C60 thin solid films have been fabricated on the (001) surfaces of alkali halides (NaCl, KCI and KBr) and muscovite by organic molecular beam deposition (OMBD) technique. Pure C60 powder was sublimated from the precisely temperature-controlled K-cell at low pressure (10−7 Torr) and deposited onto the substrates kept in the range 125 –300 °C. Increasing both the temperature of K-cell and the substrate temperature, fine crystals grow with different size, shape and distance between neighbors. The dependence of the size and density of island crystals on the deposition conditions revealed the mechanism of crystal growth and the effect of interaction between molecules and substrate surface.

In situ X-ray characterization of oligophenylene thin films prepared by organic molecular beam deposition

1998 ◽  
Vol 130-132 ◽  
pp. 651-657 ◽  
Author(s):  
Yuji Yoshida ◽  
Hiroshi Takiguchi ◽  
Takeshi Hanada ◽  
Nobutaka Tanigaki ◽  
Eun Mi Han ◽  
...  
Keyword(s):  
Thin Films ◽  
Molecular Beam ◽  
X Ray ◽  
Molecular Beam Deposition ◽  
Beam Deposition

Structural and electrical characterization of pentacene films on SiO2 grown by molecular beam deposition

2004 ◽  
Vol 464-465 ◽  
pp. 398-402 ◽  
Author(s):  
Hirotomo Yanagisawa ◽  
Tsuyoshi Tamaki ◽  
Masakazu Nakamura ◽  
Kazuhiro Kudo
Keyword(s):  
Molecular Beam ◽  
Electrical Characterization ◽  
Molecular Beam Deposition ◽  
Beam Deposition

scholarly journals Characterization of high-κ LaLuO3 thin film grown on AlGaN/GaN heterostructure by molecular beam deposition

2011 ◽  
Vol 99 (18) ◽  
pp. 182103 ◽  
Author(s):  
Shu Yang ◽  
Sen Huang ◽  
Hongwei Chen ◽  
Michael Schnee ◽  
Qing-Tai Zhao ◽  
...  
Keyword(s):  
Thin Film ◽  
Molecular Beam ◽  
Molecular Beam Deposition ◽  
Gan Heterostructure ◽  
Beam Deposition

Preparation and Characterization of 3,4,9,10-Perylenetetracarboxylic dianhydride (PTCDA) Films Deposited by Organic Molecular Beam Deposition Method

1995 ◽  
Vol 34 (Part 1, No. 7B) ◽  
pp. 3852-3857 ◽  
Author(s):  
Hiroyuki Fuchigami ◽  
Sachiko Tanimura ◽  
Yasushi Uehara ◽  
Tetsuyuki Kurata ◽  
Sei Tsunoda
Keyword(s):  
Molecular Beam ◽  
Deposition Method ◽  
Molecular Beam Deposition ◽  
Beam Deposition

Structural characterization of tetrahexyl sexithiophene ordered films grown by organic molecular beam deposition

1999 ◽  
Vol 12 (2-3) ◽  
pp. 301-305 ◽  
Author(s):  
C Botta ◽  
S Destri ◽  
W Porzio ◽  
A Sassella ◽  
A Borghesi ◽  
...  
Keyword(s):  
Structural Characterization ◽  
Molecular Beam ◽  
Molecular Beam Deposition ◽  
Beam Deposition ◽  
Ordered Films

Growth and Characterization of Copper Indium Diselenide Thin Films by Molecular Beam Deposition

1996 ◽  
Vol 426 ◽  
Author(s):  
H. Y. Ueng ◽  
D. Y. Chang ◽  
J. L. Lin
Keyword(s):  
Thin Films ◽  
Molecular Beam ◽  
X Ray Diffraction ◽  
Glass Substrates ◽  
Copper Indium ◽  
Molecular Beam Deposition ◽  
Flux Intensity ◽  
Diffraction Patterns ◽  
Beam Deposition

AbstractCuInSe2 thin films grown on Corning 7059 glass substrates were prepared by molecular beam deposition method with various Cu/In ratios in order to study the relationship between composition and material properties. Under a fixed copper beam flux intensity and overpressure selenium environments, the composition of films was modulated by changing the indium beam flux: intensity to obtain Cu-rich or In-rich films. The X-ray diffraction patterns show that the epitaxy films grown onto glass substrates are the polycrystalline structure. The grain size of polycrystalline films indicate that the surface morphology of the films are varied as a function of Cu/In ratio.

Characterization of bis(1,2,5-thiadiazolo)-p-quinobis(1,3-dithiole) thin films grown by organic molecular beam deposition

2001 ◽  
Vol 2 (3-4) ◽  
pp. 143-154 ◽  
Author(s):  
Jiangeng Xue ◽  
Jingui Qin ◽  
Peter V. Bedworth ◽  
Karen Kustedjo ◽  
Seth R. Marder ◽  
...  
Keyword(s):  
Thin Films ◽  
Molecular Beam ◽  
Molecular Beam Deposition ◽  
Beam Deposition
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