Iron Metalization of Fluorinated Organic Films:  A Combined X-ray Photoelectron Spectroscopy and Atomic Force Microscopy Study

S. R. Carlo; Anthony J. Wagner; D. Howard Fairbrother

doi:10.1021/jp0009406

Iron Metalization of Fluorinated Organic Films: A Combined X-ray Photoelectron Spectroscopy and Atomic Force Microscopy Study

The Journal of Physical Chemistry B ◽

10.1021/jp0009406 ◽

2000 ◽

Vol 104 (28) ◽

pp. 6633-6641 ◽

Cited By ~ 31

Author(s):

S. R. Carlo ◽

Anthony J. Wagner ◽

D. Howard Fairbrother

Keyword(s):

Atomic Force Microscopy ◽

Photoelectron Spectroscopy ◽

Microscopy Study ◽

Organic Films ◽

Atomic Force Microscopy Study ◽

X Ray ◽

Force Microscopy ◽

Atomic Force

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Transformation of Amyloid-like Fibers, Formed from an Elastin-Based Biopolymer, into a Hydrogel: An X-ray Photoelectron Spectroscopy and Atomic Force Microscopy Study

Biomacromolecules ◽

10.1021/bm060764s ◽

2007 ◽

Vol 8 (1) ◽

pp. 128-138 ◽

Cited By ~ 27

Author(s):

R. Flamia ◽

A. M. Salvi ◽

L. D'Alessio ◽

J. E. Castle ◽

A. M. Tamburro

Keyword(s):

Atomic Force Microscopy ◽

Photoelectron Spectroscopy ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

X Ray ◽

Force Microscopy ◽

Atomic Force

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Combined Electrochemical Impedance Spectroscopy, X-ray Photoelectron Spectroscopy, and Atomic Force Microscopy study of the distinct behavior of L-cysteine-thiolate formed at p- and n-GaAs(100) electrodes in Sodium Dodecyl Sulfate solution

Electrochimica Acta ◽

10.1016/j.electacta.2016.12.156 ◽

2017 ◽

Vol 225 ◽

pp. 551-558 ◽

Cited By ~ 3

Author(s):

Valentina Lazarescu ◽

Mirela Enache ◽

Mihai Anastasescu ◽

Gianina Dobrescu ◽

Catalin Negrila ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Photoelectron Spectroscopy ◽

Electrochemical Impedance ◽

Sodium Dodecyl ◽

Sulfate Solution ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

X Ray ◽

Force Microscopy ◽

Atomic Force

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Polymer meltingversuscrystallization: a combined small-angle X-ray scattering and atomic force microscopy study

Acta Crystallographica Section A Foundations of Crystallography ◽

10.1107/s0108767306098047 ◽

2006 ◽

Vol 62 (a1) ◽

pp. s98-s98

Author(s):

D. A. Ivanov ◽

M. Dosière ◽

M. H. J. Koch

Keyword(s):

Atomic Force Microscopy ◽

Small Angle ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

X Ray ◽

Force Microscopy ◽

X Ray Scattering ◽

Atomic Force ◽

Ray Scattering

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Nickel evaporation in high vacuum and formation of nickel oxide nanoparticles on highly oriented pyrolytic graphite. X-ray photoelectron spectroscopy and atomic force microscopy study

Thin Solid Films ◽

10.1016/j.tsf.2007.11.008 ◽

2008 ◽

Vol 516 (18) ◽

pp. 6095-6103 ◽

Cited By ~ 5

Author(s):

Jiří Franc ◽

Zdeněk Bastl

Keyword(s):

Photoelectron Spectroscopy ◽

Pyrolytic Graphite ◽

High Vacuum ◽

Microscopy Study ◽

Oxide Nanoparticles ◽

Atomic Force Microscopy Study ◽

Nickel Oxide Nanoparticles ◽

X Ray ◽

Force Microscopy ◽

Atomic Force

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X-ray/Atomic Force Microscopy Study of the Temperature-Dependent Multilayer Structure of PTCDI-C8 Films on SiO2

The Journal of Physical Chemistry C ◽

10.1021/jp808037w ◽

2009 ◽

Vol 113 (11) ◽

pp. 4502-4506 ◽

Cited By ~ 29

Author(s):

Tobias N. Krauss ◽

Esther Barrena ◽

Dimas G. de Oteyza ◽

Xue N. Zhang ◽

János Major ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Multilayer Structure ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Temperature Dependent ◽

X Ray ◽

Force Microscopy ◽

Atomic Force

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X-ray diffraction and atomic force microscopy study in aged zirconia-toughened alumina composite with dispersion of m-ZrO2 nanoparticles

International Journal of Refractory Metals and Hard Materials ◽

10.1016/j.ijrmhm.2012.06.009 ◽

2012 ◽

Vol 35 ◽

pp. 270-278 ◽

Cited By ~ 6

Author(s):

A. Reyes-Rojas ◽

E. Torres-Moye ◽

O. Solís-Canto ◽

A. Aguilar-Elguézabal ◽

M.H. Bocanegra-Bernal

Keyword(s):

Atomic Force Microscopy ◽

Microscopy Study ◽

Zro2 Nanoparticles ◽

X Ray Diffraction ◽

Atomic Force Microscopy Study ◽

X Ray ◽

Force Microscopy ◽

Atomic Force ◽

Alumina Composite ◽

Zirconia Toughened Alumina

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Photoelectron spectroscopy and atomic force microscopy study of 1,2-dicyano-methanofullerene C60(CN)2 thin film for photovoltaic applications

Solar Energy Materials and Solar Cells ◽

10.1016/j.solmat.2010.12.024 ◽

2011 ◽

Vol 95 (4) ◽

pp. 1111-1118 ◽

Cited By ~ 5

Author(s):

Vaishali Rao Koppolu ◽

Mool C. Gupta ◽

Louis Scudiero

Keyword(s):

Thin Film ◽

Atomic Force Microscopy ◽

Photoelectron Spectroscopy ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Photovoltaic Applications

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Influence of substrate morphology on growth mode of thin organic films: An atomic force microscopy study

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ◽

10.1116/1.2743654 ◽

2007 ◽

Vol 25 (4) ◽

pp. 1152 ◽

Cited By ~ 6

Author(s):

Primož Rebernik Ribič ◽

Gvido Bratina

Keyword(s):

Atomic Force Microscopy ◽

Microscopy Study ◽

Growth Mode ◽

Organic Films ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Thin Organic Films ◽

Influence Of Substrate

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A combined X-ray, ellipsometry and atomic force microscopy study on thin parylene-C films

physica status solidi (a) ◽

10.1002/pssa.200881616 ◽

2009 ◽

Vol 206 (8) ◽

pp. 1727-1730 ◽

Cited By ~ 8

Author(s):

Heinz-Georg Flesch ◽

Oliver Werzer ◽

Martin Weis ◽

Ján Jakabovič ◽

Jaroslav Kováč ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Parylene C ◽

X Ray ◽

Force Microscopy ◽

Atomic Force

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Influence of UV irradiation on unsaturated fatty acid monolayers and multilayer films: x-ray diffraction and atomic force microscopy study

Langmuir ◽

10.1021/la00033a019 ◽

1993 ◽

Vol 9 (9) ◽

pp. 2363-2369 ◽

Cited By ~ 14

Author(s):

J. P. K. Peltonen ◽

P. He ◽

J. B. Rosenholm

Keyword(s):

Atomic Force Microscopy ◽

Fatty Acid ◽

Unsaturated Fatty Acid ◽

Microscopy Study ◽

Multilayer Films ◽

X Ray Diffraction ◽

Atomic Force Microscopy Study ◽

X Ray ◽

Force Microscopy ◽

Atomic Force

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