Combined Electrochemical Impedance Spectroscopy, X-ray Photoelectron Spectroscopy, and Atomic Force Microscopy study of the distinct behavior of L-cysteine-thiolate formed at p- and n-GaAs(100) electrodes in Sodium Dodecyl Sulfate solution

2017 ◽  
Vol 225 ◽  
pp. 551-558 ◽  
Author(s):  
Valentina Lazarescu ◽  
Mirela Enache ◽  
Mihai Anastasescu ◽  
Gianina Dobrescu ◽  
Catalin Negrila ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Photoelectron Spectroscopy ◽  
Electrochemical Impedance ◽  
Sodium Dodecyl ◽  
Sulfate Solution ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force

X-ray/Atomic Force Microscopy Study of the Temperature-Dependent Multilayer Structure of PTCDI-C8 Films on SiO2

2009 ◽  
Vol 113 (11) ◽  
pp. 4502-4506 ◽  
Author(s):  
Tobias N. Krauss ◽  
Esther Barrena ◽  
Dimas G. de Oteyza ◽  
Xue N. Zhang ◽  
János Major ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Multilayer Structure ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Temperature Dependent ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force

A combined X-ray, ellipsometry and atomic force microscopy study on thin parylene-C films

2009 ◽  
Vol 206 (8) ◽  
pp. 1727-1730 ◽  
Author(s):  
Heinz-Georg Flesch ◽  
Oliver Werzer ◽  
Martin Weis ◽  
Ján Jakabovič ◽  
Jaroslav Kováč ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Parylene C ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force
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