Polarized X-ray Absorption Spectroscopy Observation of Electronic and Structural Changes of Chemical Vapor Deposition Graphene in Contact with Water

2014 ◽  
Vol 118 (44) ◽  
pp. 25456-25459 ◽  
Author(s):  
J. J. Velasco-Velez ◽  
C. H. Wu ◽  
B. Y. Wang ◽  
Y. Sun ◽  
Y. Zhang ◽  
...  
Keyword(s):  
Chemical Vapor Deposition ◽  
Absorption Spectroscopy ◽  
Vapor Deposition ◽  
Structural Changes ◽  
Chemical Vapor ◽  
X Ray ◽  
Chemical Vapor Deposition Graphene ◽  
X Ray Absorption ◽  
Spectroscopy Observation

scholarly journals Synchrotron Radiation X-Ray Absorption Spectroscopy and Spectroscopic Ellipsometry Studies of InSb Thin Films on GaAs Grown by Metalorganic Chemical Vapor Deposition

2018 ◽  
Vol 2018 ◽  
pp. 1-11 ◽  
Author(s):  
Yingda Qian ◽  
Yuanlan Liang ◽  
Xuguang Luo ◽  
Kaiyan He ◽  
Wenhong Sun ◽  
...  
Keyword(s):  
Chemical Vapor Deposition ◽  
Synchrotron Radiation ◽  
Absorption Spectroscopy ◽  
Spectroscopic Ellipsometry ◽  
Vapor Deposition ◽  
Metalorganic Chemical Vapor Deposition ◽  
Chemical Vapor ◽  
X Ray ◽  
X Ray Absorption ◽  
Metalorganic Chemical

A series of ultrathin InSb films grown on GaAs by low-pressure metalorganic chemical vapor deposition with different V/III ratios were investigated thoroughly using spectroscopic ellipsometry (SE), X-ray diffraction, and synchrotron radiation X-ray absorption spectroscopy. The results predicted that InSb films on GaAs grown under too high or too low V/III ratios are with poor quality, while those grown with proper V/III ratios of 4.20–4.78 possess the high crystalline quality. The temperature-dependent SE (20–300°C) and simulation showed smooth variations of SE spectra, optical constants (n, k, e1, and ε2), and critical energy points (E1, E1+Δ1, E′0, E2, and E′1) for InSb film when temperature increased from 20°C to 250°C, while at 300°C, large changes appeared. Our study revealed the oxidation of about two atomic layers and the formation of an indium-oxide (InO) layer of ∼5.4 nm. This indicates the high temperature limitation for the use of InSb/GaAs materials, up to 250°C.

Contribution of the x‐ray absorption spectroscopy to study TiO2thin films prepared by ion beam induced chemical vapor deposition

1995 ◽  
Vol 77 (2) ◽  
pp. 591-597 ◽  
Author(s):  
A. Caballero ◽  
D. Leinen ◽  
A. Fernández ◽  
A. Justo ◽  
J. P. Espinós ◽  
...  
Keyword(s):  
Chemical Vapor Deposition ◽  
Absorption Spectroscopy ◽  
Vapor Deposition ◽  
Ion Beam ◽  
Chemical Vapor ◽  
X Ray ◽  
X Ray Absorption

Determination of Zn-containing sites in β-Ga2O3 film grown through mist chemical vapor deposition via X-ray absorption spectroscopy

2020 ◽  
Vol 59 (7) ◽  
pp. 070909
Author(s):  
Noritake Isomura ◽  
Tatsuji Nagaoka ◽  
Yukihiko Watanabe ◽  
Katsuhiro Kutsuki ◽  
Hiroyuki Nishinaka ◽  
...  
Keyword(s):  
Chemical Vapor Deposition ◽  
Absorption Spectroscopy ◽  
Vapor Deposition ◽  
Chemical Vapor ◽  
X Ray ◽  
Ga2o3 Film ◽  
X Ray Absorption

A soft X-ray absorption study of nanodiamond films prepared by hot-filament chemical vapor deposition

2003 ◽  
Vol 372 (3-4) ◽  
pp. 320-324 ◽  
Author(s):  
Y.H Tang ◽  
X.T Zhou ◽  
Y.F Hu ◽  
C.S Lee ◽  
S.T Lee ◽  
...  
Keyword(s):  
Chemical Vapor Deposition ◽  
Vapor Deposition ◽  
Chemical Vapor ◽  
Absorption Study ◽  
X Ray ◽  
Hot Filament ◽  
X Ray Absorption

Synchrotron Radiation X-Ray Absorption and Optical Studies of Cubic SiC Films Grown on Si by Chemical Vapor Deposition

2011 ◽  
Vol 306-307 ◽  
pp. 167-170
Author(s):  
Yu Li Tu ◽  
Yan Hao Huang ◽  
Ling Min Kong ◽  
Kung Yen Lee ◽  
Ling Yun Jang ◽  
...  
Keyword(s):  
Chemical Vapor Deposition ◽  
Synchrotron Radiation ◽  
Vapor Deposition ◽  
Chemical Vapor ◽  
Peak Frequency ◽  
Atomic Scale ◽  
X Ray ◽  
Physical And Chemical ◽  
X Ray Absorption ◽  
Sic Films

Synchrotron radiation extended X-ray absorption fine structure and Raman scattering were used to characterize a series of 3C-SiC films grown on Si (100) by chemical vapor deposition. EXAFS can probe the physical and chemical structure of matters at an atomic scale and Raman parameters such as intensity, width, peak frequency and polarization provide fruitful information on the crystal quality and properties of these film materials.

X‐ray absorption fine structure of diamond films grown by chemical vapor deposition

1989 ◽  
Vol 55 (10) ◽  
pp. 957-959 ◽  
Author(s):  
T. W. Capehart ◽  
T. A. Perry ◽  
C. B. Beetz ◽  
D. N. Belton ◽  
G. B. Fisher ◽  
...  
Keyword(s):  
Fine Structure ◽  
Chemical Vapor Deposition ◽  
Vapor Deposition ◽  
Diamond Films ◽  
Chemical Vapor ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

X‐ray absorption study of diamond films grown by chemical vapor deposition

1991 ◽  
Vol 9 (3) ◽  
pp. 1140-1144 ◽  
Author(s):  
X.‐Q. Yang ◽  
M. W. Ruckman ◽  
T. A. Skotheim ◽  
M. den Boer ◽  
Yu Zheng ◽  
...  
Keyword(s):  
Chemical Vapor Deposition ◽  
Vapor Deposition ◽  
Diamond Films ◽  
Chemical Vapor ◽  
Absorption Study ◽  
X Ray ◽  
X Ray Absorption
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