Electrochemical Layer-by-Layer Deposition of Pseudomorphic Pt Layers on Au(111) Electrode Surface Confirmed by Electrochemical and In Situ Resonance Surface X-ray Scattering Measurements

2012 ◽  
Vol 116 (50) ◽  
pp. 26464-26474 ◽  
Author(s):  
Masayo Shibata ◽  
Naoko Hayashi ◽  
Takara Sakurai ◽  
Ayumi Kurokawa ◽  
Hitoshi Fukumitsu ◽  
...  
Keyword(s):  
Electrode Surface ◽  
Layer By Layer ◽  
X Ray ◽  
X Ray Scattering ◽  
Layer Deposition ◽  
Scattering Measurements ◽  
Resonance Surface ◽  
Ray Scattering

scholarly journals Hydrostatic low-range pressure applications of the Paris–Edinburgh cell utilizing polymer gaskets for diffuse X-ray scattering measurements

2007 ◽  
Vol 40 (1) ◽  
pp. 196-198 ◽  
Author(s):  
Karena W. Chapman ◽  
Peter J. Chupas ◽  
Charles A. Kurtz ◽  
Darren R. Locke ◽  
John B. Parise ◽  
...  
Keyword(s):  
Pair Distribution Function ◽  
Function Analysis ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Measurements ◽  
Fine Control ◽  
Gasket Material ◽  
Ray Scattering

The use of a polymeric Torlon (polyamide–imide) gasket material in a Paris–Edinburgh pressure cell forin situhigh-pressure X-ray scattering measurements is demonstrated. The relatively low bulk modulus of the gasket allows for fine control of the sample pressure over the range 0.01–0.42 GPa. The quality of the data obtained in this way is suitable for Bragg and pair distribution function analysis.

Time Resolved In-Situ Diffuse X-ray Scattering Measurements of the Surface Morphology of Homoepitaxial SrTiO3 Films During Pulsed Laser Deposition

2007 ◽  
Vol 1034 ◽  
Author(s):  
John David Ferguson ◽  
Arthur R. Woll ◽  
Gokhan Arikan ◽  
Darren S. Dale ◽  
Aram Amassian ◽  
...  
Keyword(s):  
Pulsed Laser Deposition ◽  
Diffuse Scattering ◽  
Pulsed Laser ◽  
Peak Position ◽  
Laser Deposition ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Measurements ◽  
Ray Scattering

AbstractHomoepitaxial SrTiO3 thin films were grown on SrTiO3 (001) using Pulsed Laser Deposition (PLD). The deposition process was monitored in-situ, via both x-ray reflectivity and surface diffuse x-ray scattering measurements in the G3 experimental station at the Cornell High Energy Synchrotron Source (CHESS). Using a CCD detector in 1D, or streak-camera, mode with approximately 0.3-second time resolution, data were collected during growths performed at two substrate temperatures: 695°C and 1000°C. While the specular reflectivity oscillations for the two growths are very similar, the diffuse scattering clearly shows a distinct change in the peak position. Using Atomic Force Microscopy (AFM), we illustrate how the peak position for the diffuse lobes of scattered intensity is directly related to the distribution of single unit cell high islands on the growing surface. Thus, the peak shift of the diffuse scattering indicates an order of magnitude change in the island density.

A novel spectroelectrochemical cell for in situ surface X-ray scattering measurements of single crystal disk electrodes

2002 ◽  
Vol 47 (19) ◽  
pp. 3075-3080 ◽  
Author(s):  
Toshihiro Kondo ◽  
Kazuhisa Tamura ◽  
Masamitu Takahasi ◽  
Jun-ichiro Mizuki ◽  
Kohei Uosaki
Keyword(s):  
Single Crystal ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Measurements ◽  
Disk Electrodes ◽  
Ray Scattering

scholarly journals First In Situ X-ray Scattering Measurements of Insect Body Surface Lipids: American Cockroach

2021 ◽  
Vol 12 (7) ◽  
pp. 1969-1972
Author(s):  
Fumitoshi Kaneko ◽  
Chihiro Katagiri ◽  
Ken Nagashima ◽  
Gen Sazaki
Keyword(s):  
Body Surface ◽  
American Cockroach ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Measurements ◽  
Surface Lipids ◽  
Ray Scattering
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