Mass Spectrometry and Photoelectron Spectroscopy of Tetracene Cluster Anions, (Tetracene) (n= 1−100):  Evidence for the Highly Localized Nature of Polarization in a Cluster Analogue of Oligoacene Crystals

2007 ◽  
Vol 111 (39) ◽  
pp. 9644-9648 ◽  
Author(s):  
Masaaki Mitsui ◽  
Naoto Ando ◽  
Atsushi Nakajima
Keyword(s):  
Mass Spectrometry ◽  
Photoelectron Spectroscopy ◽  
Cluster Anions

Cobalt–benzene cluster anions: Mass spectrometry and negative ion photoelectron spectroscopy

2002 ◽  
Vol 116 (23) ◽  
pp. 10247-10252 ◽  
Author(s):  
M. Gerhards ◽  
O. C. Thomas ◽  
J. M. Nilles ◽  
W.-J. Zheng ◽  
K. H. Bowen
Keyword(s):  
Mass Spectrometry ◽  
Photoelectron Spectroscopy ◽  
Negative Ion ◽  
Cluster Anions

Interaction of Bovine Serum Albumin and Lysozyme with Stainless Steel Studied by Time-of-Flight Secondary Ion Mass Spectrometry and X-ray Photoelectron Spectroscopy

Langmuir ◽  
2012 ◽  
Vol 28 (47) ◽  
pp. 16306-16317 ◽  
Author(s):  
Yolanda S. Hedberg ◽  
Manuela S. Killian ◽  
Eva Blomberg ◽  
Sannakaisa Virtanen ◽  
Patrik Schmuki ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Stainless Steel ◽  
Bovine Serum Albumin ◽  
Serum Albumin ◽  
Photoelectron Spectroscopy ◽  
Bovine Serum ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
X Ray ◽  
Secondary Ion

Photoelectron spectroscopy of mixed metal cluster anions: NiCu−, NiAg−, NiAg−2, and Ni2Ag−

1996 ◽  
Vol 104 (13) ◽  
pp. 4902-4910 ◽  
Author(s):  
St. J. Dixon‐Warren ◽  
R. F. Gunion ◽  
W. C. Lineberger
Keyword(s):  
Photoelectron Spectroscopy ◽  
Metal Cluster ◽  
Cluster Anions ◽  
Mixed Metal ◽  
Mixed Metal Cluster

Chromium implantation in silica glass

1996 ◽  
Vol 11 (1) ◽  
pp. 229-235 ◽  
Author(s):  
E. Cattaruzza ◽  
R. Bertoncello ◽  
F. Trivillin ◽  
P. Mazzoldi ◽  
G. Battaglin ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Photoelectron Spectroscopy ◽  
Silica Glass ◽  
Electron Spectroscopy ◽  
Auger Electron ◽  
Secondary Ion Mass Spectrometry ◽  
Rutherford Backscattering Spectrometry ◽  
X Ray ◽  
Chromium Silicide ◽  
Secondary Ion

Silica glass was implanted with chromium at the energy of 35 and 160 keV and at fluences varying from 1 × 1016 to 11 × 1016 ions cm−2. In a set of chromium-implanted samples significant amounts of carbon were detected. Samples were characterized by x-ray photoelectron spectroscopy, x-ray-excited Auger electron spectroscopy, secondary ion mass spectrometry, and Rutherford backscattering spectrometry. Chromium silicide and chromium oxide compounds were observed; the presence of carbon in the implanted layers induces the further formation of chromium carbide species. Thermodynamic considerations applied to the investigated systems supply indications in agreement with the experimental evidences.

Mass Selected ZEKE-Spectra of FeC2-Anions: A Spectroscopic Access to Intermediates in Catalytic Reactions of Hydrocarbons on Metal Surfaces

1994 ◽  
Vol 49 (12) ◽  
pp. 1256-1258 ◽  
Author(s):  
G. Drechsler ◽  
C. Bäßmann ◽  
U. Boesl ◽  
E. W. Schlag
Keyword(s):  
Mass Spectrometry ◽  
Photoelectron Spectroscopy ◽  
Metal Surfaces ◽  
Catalytic Reactions ◽  
Photoelectron Spectra ◽  
Mass Analyzer ◽  
Flight Mass Spectrometry ◽  
New Information ◽  
Zero Kinetic Energy ◽  
Conventional Laser

Abstract Zero-kinetic-energy (ZEKE) photoelectron spectra of metalcarbide anions are presented, allowing a high resolu­tion spectroscopic access to intermediates in catalytic reac­tions of hydrocarbons on metal surfaces. As a first compound, FeC2 (an intermediate of the iron/acetylene system) has been chosen. Important for successful ZEKE spectroscopy was a special anion source and the selection by time-of-flight mass spectrometry. In addition, conventional laser induced photo­ detachment photoelectron spectroscopy in combination with our anion source and mass analyzer delivered valuable new information.

Photoelectron spectroscopy of chromium-doped silicon cluster anions

2005 ◽  
Vol 122 (7) ◽  
pp. 071101 ◽  
Author(s):  
Weijun Zheng ◽  
J. Michael Nilles ◽  
Dunja Radisic ◽  
Kit H. Bowen
Keyword(s):  
Photoelectron Spectroscopy ◽  
Silicon Cluster ◽  
Cluster Anions ◽  
Doped Silicon
Sign in / Sign up

Export Citation Format

Share Document