Photoelectron spectroscopy of chromium-doped silicon cluster anions

2005 ◽  
Vol 122 (7) ◽  
pp. 071101 ◽  
Author(s):  
Weijun Zheng ◽  
J. Michael Nilles ◽  
Dunja Radisic ◽  
Kit H. Bowen
Keyword(s):  
Photoelectron Spectroscopy ◽  
Silicon Cluster ◽  
Cluster Anions ◽  
Doped Silicon

Vibrationally resolved photoelectron spectroscopy of silicon cluster anions Sin− (n=3–7)

1998 ◽  
Vol 108 (4) ◽  
pp. 1395-1406 ◽  
Author(s):  
Cangshan Xu ◽  
Travis R. Taylor ◽  
Gordon R. Burton ◽  
Daniel M. Neumark
Keyword(s):  
Photoelectron Spectroscopy ◽  
Silicon Cluster ◽  
Cluster Anions

Photoelectron spectroscopy of europium-silicon cluster anions, EuSin− (3⩽n⩽17)

2008 ◽  
Vol 129 (5) ◽  
pp. 054302 ◽  
Author(s):  
Andrej Grubisic ◽  
Haopeng Wang ◽  
Yeon Jae Ko ◽  
Kit H. Bowen
Keyword(s):  
Photoelectron Spectroscopy ◽  
Silicon Cluster ◽  
Cluster Anions

Photoelectron spectroscopy of mixed metal cluster anions: NiCu−, NiAg−, NiAg−2, and Ni2Ag−

1996 ◽  
Vol 104 (13) ◽  
pp. 4902-4910 ◽  
Author(s):  
St. J. Dixon‐Warren ◽  
R. F. Gunion ◽  
W. C. Lineberger
Keyword(s):  
Photoelectron Spectroscopy ◽  
Metal Cluster ◽  
Cluster Anions ◽  
Mixed Metal ◽  
Mixed Metal Cluster

High-resolution ion mobility measurements for silicon cluster anions and cations

1999 ◽  
Vol 111 (17) ◽  
pp. 7865-7870 ◽  
Author(s):  
Robert R. Hudgins ◽  
Motoharu Imai ◽  
Martin F. Jarrold ◽  
Philippe Dugourd
Keyword(s):  
High Resolution ◽  
Ion Mobility ◽  
Silicon Cluster ◽  
Cluster Anions ◽  
Anions And Cations

scholarly journals Photoelectron spectroscopy of jet-cooled aluminium cluster anions

1988 ◽  
Vol 9 (3) ◽  
pp. 253-261 ◽  
Author(s):  
G. Gantef�r ◽  
M. Gausa ◽  
K. H. Meiwes-Broer ◽  
H. O. Lutz
Keyword(s):  
Photoelectron Spectroscopy ◽  
Cluster Anions

Formation and Photoelectron Spectroscopy of Nanoscale Cluster Anions of Biphenyl, (BP)n−(n= 2–100)

2005 ◽  
Vol 34 (9) ◽  
pp. 1244-1245 ◽  
Author(s):  
Masaaki Mitsui ◽  
Yukino Matsumoto ◽  
Naoto Ando ◽  
Atsushi Nakajima
Keyword(s):  
Photoelectron Spectroscopy ◽  
Cluster Anions

scholarly journals Phosphorus Behavior in Heavily Phosphorus-Doped Silicon Surfaces due to Annealing. X-Ray Photoelectron Spectroscopy and Secondary Ion Mass Spectroscopy.

Shinku ◽  
1995 ◽  
Vol 38 (3) ◽  
pp. 295-298 ◽  
Author(s):  
Wen Biao YING ◽  
Yusuke MIZOKAWA ◽  
Yoshitomo KAMIURA ◽  
Yong Bing YU ◽  
Masafumi NISHIMATSU ◽  
...  
Keyword(s):  
Mass Spectroscopy ◽  
Photoelectron Spectroscopy ◽  
Silicon Surfaces ◽  
Secondary Ion Mass Spectroscopy ◽  
X Ray ◽  
Doped Silicon ◽  
Phosphorus Doped ◽  
Secondary Ion
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