Determination of critical micelle concentrations in micellar and reversed micellar systems by positron annihilation techniques

Yan-Ching Jean; Hans J. Ache

doi:10.1021/ja00471a061

Determination of critical micelle concentrations in micellar and reversed micellar systems by positron annihilation techniques

Journal of the American Chemical Society ◽

10.1021/ja00471a061 ◽

1978 ◽

Vol 100 (3) ◽

pp. 984-985 ◽

Cited By ~ 46

Author(s):

Yan-Ching Jean ◽

Hans J. Ache

Keyword(s):

Positron Annihilation ◽

Critical Micelle Concentrations ◽

Micellar Systems

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ChemInform Abstract: DETERMINATION OF CRITICAL MICELLE CONCENTRATIONS IN MICELLAR AND REVERSED MICELLAR SYSTEMS BY POSITRON ANNIHILATION TECHNIQUES

Chemischer Informationsdienst ◽

10.1002/chin.197820080 ◽

1978 ◽

Vol 9 (20) ◽

Author(s):

Y. JEAN ◽

H. J. ACHE

Keyword(s):

Positron Annihilation ◽

Critical Micelle Concentrations ◽

Micellar Systems

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Equilibria in micellar systems. Photometric determination of vanadium with 6-hydroxy-5-dibenzo(a,j)phenoxazone-8,11-disulphonic acid activated by cetyltrimethylammonium bromide

Collection of Czechoslovak Chemical Communications ◽

10.1135/cccc19771941 ◽

1977 ◽

Vol 42 (6) ◽

pp. 1941-1948 ◽

Cited By ~ 2

Author(s):

J. Lasovský ◽

E. Ružička

Keyword(s):

Cetyltrimethylammonium Bromide ◽

Photometric Determination ◽

Micellar Systems ◽

Disulphonic Acid

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Determination of nanoobject sizes and concentrations in irradiated metals and alloys via positron annihilation spectroscopy

Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques ◽

10.1134/s102745101107010x ◽

2011 ◽

Vol 5 (4) ◽

pp. 636-646 ◽

Cited By ~ 2

Author(s):

V. I. Grafutin ◽

E. P. Prokop’ev ◽

V. Krsjak ◽

R. Burcl ◽

P. Häehner ◽

...

Keyword(s):

Positron Annihilation ◽

Positron Annihilation Spectroscopy ◽

Metals And Alloys

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Novel Fluorescence Spectral Deconvolution Method for Determination of Critical Micelle Concentrations Using the Fluorescence Probe PRODAN

Langmuir ◽

10.1021/la981716z ◽

1999 ◽

Vol 15 (19) ◽

pp. 6181-6186 ◽

Cited By ~ 40

Author(s):

J. E. Wong ◽

T. M. Duchscherer ◽

G. Pietraru ◽

D. T. Cramb

Keyword(s):

Fluorescence Probe ◽

Deconvolution Method ◽

Spectral Deconvolution ◽

Critical Micelle Concentrations ◽

Spectral Deconvolution Method

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A New Method for the Determination of Critical Micelle Concentrations of Un-ionized Associations Colloids in Aqueous or in Non-aqueous Solution

The Journal of Physical Chemistry ◽

10.1021/j150580a025 ◽

1959 ◽

Vol 63 (10) ◽

pp. 1671-1674 ◽

Cited By ~ 127

Author(s):

Sydney Ross ◽

J. P. Olivier

Keyword(s):

Aqueous Solution ◽

New Method ◽

Critical Micelle Concentrations

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Determination of the quantum density matrix from experiment: An application to positron annihilation

Physical Review B ◽

10.1103/physrevb.33.5987 ◽

1986 ◽

Vol 33 (9) ◽

pp. 5987-5993 ◽

Cited By ~ 19

Author(s):

L. M. Pecora

Keyword(s):

Density Matrix ◽

Positron Annihilation

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Recent Developments in the Determination of Positron Annihilation Rate Distributions by Regularized Solution of Integral Equations

Materials Science Forum ◽

10.4028/www.scientific.net/msf.105-110.1871 ◽

1992 ◽

Vol 105-110 ◽

pp. 1871-1874 ◽

Cited By ~ 1

Author(s):

R.B. Gregory

Keyword(s):

Positron Annihilation ◽

Integral Equations ◽

Annihilation Rate ◽

Recent Developments ◽

Regularized Solution

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Micellar and Reverse Micellar Systems: Positron Annihilation Studies

Encyclopedia of Surface and Colloid Science, Third Edition ◽

10.1081/e-escs3-120000050 ◽

2015 ◽

pp. 4269-4281

Author(s):

Bichitra Nandi Ganguly

Keyword(s):

Positron Annihilation ◽

Micellar Systems ◽

Reverse Micellar Systems ◽

Reverse Micellar

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Difference spectrophotometric method for the determination of critical micelle concentrations

The Journal of Physical Chemistry ◽

10.1021/j100676a014 ◽

1971 ◽

Vol 75 (6) ◽

pp. 804-808 ◽

Cited By ~ 38

Author(s):

George. Nemethy ◽

Ashoka. Ray

Keyword(s):

Spectrophotometric Method ◽

Critical Micelle Concentrations

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Determination of the defect depth profile after saw cutting of GaAs wafers measured by positron annihilation

Journal of Applied Physics ◽

10.1063/1.368291 ◽

1998 ◽

Vol 84 (4) ◽

pp. 2255-2262 ◽

Cited By ~ 10

Author(s):

F. Börner ◽

S. Eichler ◽

A. Polity ◽

R. Krause-Rehberg ◽

R. Hammer ◽

...

Keyword(s):

Positron Annihilation ◽

Depth Profile ◽

Defect Depth

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