An Immunosensor for the Automatic Determination of the Antifouling Agent Irgarol 1051 in Natural Waters

1998 ◽  
Vol 32 (21) ◽  
pp. 3442-3447 ◽  
Author(s):  
Miguel Angel González-MartÍnez ◽  
José Penalva ◽  
Rosa Puchades ◽  
Angel Maquieira ◽  
Berta Ballesteros ◽  
...  
Keyword(s):  
Natural Waters ◽  
Automatic Determination ◽  
Irgarol 1051 ◽  
Antifouling Agent

Influence of the Hapten Design on the Development of a Competitive ELISA for the Determination of the Antifouling Agent Irgarol 1051 at Trace Levels

1998 ◽  
Vol 70 (19) ◽  
pp. 4004-4014 ◽  
Author(s):  
Berta Ballesteros ◽  
Damià Barceló ◽  
Francisco Sanchez-Baeza ◽  
Francisco Camps ◽  
María-Pilar Marco
Keyword(s):  
Competitive Elisa ◽  
Irgarol 1051 ◽  
Hapten Design ◽  
Antifouling Agent

Semi-automatic determination of manganese in natural waters and plant digests by flow injection analysis

The Analyst ◽  
1979 ◽  
Vol 104 (1237) ◽  
pp. 371 ◽  
Author(s):  
M. F. Giné ◽  
E. A. G. Zagatto ◽  
H. Bergamin Filho
Keyword(s):  
Flow Injection ◽  
Flow Injection Analysis ◽  
Natural Waters ◽  
Automatic Determination

Automatic determination of iodine species in natural waters by a new flow-through electrode system

1985 ◽  
Vol 57 (6) ◽  
pp. 1157-1160 ◽  
Author(s):  
Eiichiro. Nakayama ◽  
Takashi. Kimoto ◽  
Satoshi. Okazaki
Keyword(s):  
Natural Waters ◽  
Electrode System ◽  
Automatic Determination ◽  
Iodine Species ◽  
Flow Through

On Automatic Determination of Movement Phases in Manual Transport During the Precision Grip

2000 ◽  
Vol 28 (1-2) ◽  
pp. 237-245 ◽  
Author(s):  
Nasser Hosseini ◽  
Blanka Hejdukova ◽  
Pall E. Ingvarsson ◽  
Bo Johnels ◽  
Torsten Olsson
Keyword(s):  
Precision Grip ◽  
Automatic Determination

Automatic Determination of Optimal FIB Operations for Improved Circuit Probing and Fast Reconfiguration

2000 ◽  
Author(s):  
Romain Desplats ◽  
Timothee Dargnies ◽  
Jean-Christophe Courrege ◽  
Philippe Perdu ◽  
Jean-Louis Noullet
Keyword(s):  
Integrated Circuit ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Semiconductor Devices ◽  
Front Side ◽  
Automatic Determination ◽  
Metal Line ◽  
New Approach ◽  
Metal Layers

Abstract Focused Ion Beam (FIB) tools are widely used for Integrated Circuit (IC) debug and repair. With the increasing density of recent semiconductor devices, FIB operations are increasingly challenged, requiring access through 4 or more metal layers to reach a metal line of interest. In some cases, accessibility from the front side, through these metal layers, is so limited that backside FIB operations appear to be the most appropriate approach. The questions to be resolved before starting frontside or backside FIB operations on a device are: 1. Is it do-able, are the metal lines accessible? 2. What is the optimal positioning (e.g. accessing a metal 2 line is much faster and easier than digging down to a metal 6 line)? (for the backside) 3. What risk, time and cost are involved in FIB operations? In this paper, we will present a new approach, which allows the FIB user or designer to calculate the optimal FIB operation for debug and IC repair. It automatically selects the fastest and easiest milling and deposition FIB operations.

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