Synthesis and Physical Properties of Semiconductor Nanocrystals Formed by Ion Implantation

Author(s):  
Jane G. Zhu ◽  
C. W. White ◽  
S. P. Withrow ◽  
J. D. Budai ◽  
R. Mu ◽  
...  
1997 ◽  
Vol 504 ◽  
Author(s):  
C. W. White ◽  
J. D. Budai ◽  
A. L. Meldrum ◽  
S. P. Withrow ◽  
R. A. Zuhr ◽  
...  

ABSTRACTSequential ion implantation followed by thermal annealing has been used to form encapsulated CdS, ZnS, and PbS nanocrystals in SiO2 and Al2O3 matrices. In SiO2, nanoparticles are nearly spherical and randomly oriented, and ZnS and PbS nanocrystals exhibit bimodal size distributions. In Al2O3, nanoparticles are facetted and oriented with respect to the matrix. Initial photoluminescence (PL) results are presented.


1998 ◽  
Vol 540 ◽  
Author(s):  
A. Meldrum ◽  
L.A. Boatner ◽  
C.W. White ◽  
D.O. Henderson

AbstractRadiation effects in nonmetals have been studied for well over a century by geologists, mineralogists, physicists, and materials scientists. The present work focuses on recent results of investigations of the ion-beam-induced amorphization of the ABO4 compounds – including the orthophosphates (LnPO4; Ln = lanthanides) and the orthosilicates: zircon (ZrSiO4), hafnon (HfSiO4), and thorite (ThSiO4). In the case of the orthosilicates, heavy-ion irradiation at elevated temperatures causes the precipitation of a nanocrystalline metal oxide. Electron irradiation effects in these amorphized insulating ceramics can produce localized recrystallization on a nanometer scale. Similar electron irradiation techniques were used to nucleate monodispersed compound semiconductor nanocrystals formed by ion implantation of the elemental components into fused silica. Methods for the formation of novel structural relationships between embedded nanocrystals and their hosts have been developed and the results presented here demonstrate the general flexibility of ion implantation and irradiation techniques for producing unique near-surface microstructures in ion-implanted host materials.


1996 ◽  
Vol 46 (S3) ◽  
pp. 1479-1480
Author(s):  
Vasilij Šmatko ◽  
Pavol Čičmanec ◽  
František Hanic ◽  
Vladimír Štrbík ◽  
Štefan Beňačka ◽  
...  

Author(s):  
J. Narayan ◽  
D. Fathy

The structure of amorphous silicon determines its physical properties ranging from crystallization kinetics to efficiency of solar cells. One point of particular interest has been the existance of microcrystallites in the amorphous phase. Different crystallization kinetics are obtained for purely amorphous silicon and for amorphous silicon having a trace of crystallinity. The incorporation of dopants into substitutional sites after solid-phase crystallization has been also found to be affected by the degree of amorphousness.The purpose of this investigation was two fold: first, to characterize the structure of amorphous silicon, and second to study the structure of amorphous-crystalline interface. The importance of these two factors in the crystallization phenomena is discussed.


Author(s):  
Jane G. Zhu ◽  
C. W. White ◽  
J. D. Budai ◽  
S. P. Withrow

Quantum confinement effects and enhanced optical nonlinearity are expected from II-VI semiconductor nanocrystals, which are important for novel opto-electronic device applications. The ion implantation method has been used in our study to form CdS nanocrystals inside amorphous SiO2. The CdS nanocrystals were studied by transmission electron microscopy (TEM).The samples were implanted (at room temperature) with equal doses (1×1017 ions/cm2) of Cd and S into a SiO2 layer on (100) silicon substrates and then annealed under Ar + 4%H2 ambient at 800°C and 1000°C for 1 h. Implant energies were chosen to overlap the Cd and S ion profiles in the middle of the oxide layer. CdS precipitates are formed during the thermal annealing.The effect of annealing temperatures on the nanocrystals size distributions are revealed in Figs. 1 and 2. The sizes of CdS nanocrystals are in the range of 2 - 11 nm for the sample annealed at 800°C, and in the range of a few to 16 nm for the sample annealed at 1000°C.


1998 ◽  
Vol 536 ◽  
Author(s):  
A. Meldrum ◽  
S. P. Withrow ◽  
R. A. Zuhr ◽  
C. W. White ◽  
L. A. Boatnerl ◽  
...  

AbstractIon implantation is a versatile technique by which compound semiconductor nanocrystals may be synthesized in a wide variety of host materials. The component elements that form the compound of interest are implanted sequentially into the host, and nanocrystalline precipitates then form during thermal annealing. Using this technique, we have synthesized compound semiconductor nanocrystal precipitates of ZnS, CdS, PbS, and CdSe in a fused silica matrix. The resulting microstructures and size distributions were investigated by cross-sectional transmission electron microscopy. Several unusual microstructures were observed, including a band of relatively large nanocrystals at the end of the implant profile for ZnS and CdSe, polycrystalline agglomerates of a new phase such as γ-Zn 2SiO4, and the formation of central voids inside CdS nanocrystals. While each of these microstructures is of fundamental interest, such structures are generally not desirable for potential device applications for which a uniform, monodispersed array of nanocrystals is required. Methods were investigated by which these unusual microstructures could be eliminated.


1983 ◽  
Vol 27 ◽  
Author(s):  
H.B. Dietrich ◽  
R.J. Corazzi ◽  
W.F. Tseng

AbstractSubstrates can undergo major temperature excursions during ion implantation if they are not well heat sunk. At power densities on the order of 50 watts per cm−2 radiatively cooled Si will melt in a matter of seconds. Such power densities can be maintained over a few sq. cms with many of the beams produced by even the moderate current machines currently used for doping Si and the III-V's. We have made use of this fact to study pulsed ion-beam annealing of implanted Si. Two types of studies have been carried out. In the first, 5–20 sec proton irradiations were done at power densities of 3–35 watts cm−2 to produce sample temperatures of 500 to 1100°C. 2×1016 cm−2 280 keV B, BF2 , As and P implants were annealed in this manner. Sheet resistances, ρs, versus power density curves were obtained for each ion and compared to psρs vs T data obtained for furnace annealed companion samples. In the second study the 2×1016cm−2 280 keV implants were carried out at progressively higher current densities so that the dopant beam itself raised the sample temperature to 500–1000°C. For each ion (other than B) it was possible to obtain power densities which resulted in self-annealing implants whose sheet resistances were as low as those obtained with the optimal furnace anneal. Details of the experiments, electrical and physical properties of the pulsed ion-beam annealed layers and device applications will be presented in this paper.


2018 ◽  
Vol 72 (5) ◽  
pp. 604-609 ◽  
Author(s):  
Zahra Jedi-Soltanabadi ◽  
Mahmood Ghoranneviss ◽  
Zohreh Ghorannevis ◽  
Hossein Akbari

COSMOS ◽  
2010 ◽  
Vol 06 (02) ◽  
pp. 235-245
Author(s):  
YIN THAI CHAN

Significant efforts in the field of colloidal semiconductor particles have been dedicated to the fabrication and study of hybrid metal–semiconductor nanoheterostructures, where the incorporation of the metal moiety may potentially enhance and/or expand existing applications of semiconductor nanoparticles. Many of these metal–semiconductor nanostructured constructs exhibit physical properties not found in either of their metal or semiconductor components, providing many opportunities for further investigation into interface and coupling effects between the two materials. We review some of the key research endeavors in this area, focusing mainly on the synthesis of the materials and the characterization of the various metal–semiconductor constructs, and highlighting some of the unique applications that have emerged from these efforts.


Sign in / Sign up

Export Citation Format

Share Document