Thermally Induced Percolational Transition and Thermal Stability of Silver Nanowire Networks Studied by THz Spectroscopy

2014 ◽  
Vol 6 (23) ◽  
pp. 20994-20999 ◽  
Author(s):  
Jing-Zhi Chen ◽  
Hyeyoung Ahn ◽  
Shin-Chun Yen ◽  
Yao-Jiun Tsai
2020 ◽  
Vol 8 (26) ◽  
pp. 8876-8886
Author(s):  
Henning Maximilian Sturmeit ◽  
Iulia Cojocariu ◽  
Matteo Jugovac ◽  
Albano Cossaro ◽  
Alberto Verdini ◽  
...  

The strong molecule-surface interaction, followed by charge transfer at the interface, plays a fundamental role in the thermal stability of the layer by rigidly anchoring the porphyrin molecules to the copper substrate.


1999 ◽  
Vol 576 ◽  
Author(s):  
I. Honma ◽  
A. Endo ◽  
D. Kundu ◽  
H. S. Zhou

ABSTRACTThin films of mesoporous materials have been synthesized recently as lamellar, one dimensional hexagonal and cubic structures at substrate surfaces as well as at air/liquid interfaces. The present work investigates thermally induced structural changes of lamellar and one-dimensional hexagonal(1-dH) mesostructured silicate thin films, which is less known at the moment. The 1-dH films proved to be much more thermally stable than the lamellar ones; Open-pore one dimensionalhexagonalmesoporous thin films are obtained by the calcination of the films, where as the lamellarphase has collapsed after the surfactants removal.


1992 ◽  
Vol 262 ◽  
Author(s):  
Masami Kouketsu ◽  
Seiichi Isomae

ABSTRACTThermal stability of SiHn (n=1∼4) configurations in FZ silicon crystals grown in Ar/H2 has been investigated by means of infrared absorption spectroscopy. Infrared absorption peaks at 2210, 2192, 2123 and 1946 cm−1, which are due to SiH4, SiH3, SiH2 and SiH units in silicon lattice, has been observed. It is found that the concentration of SiH4 and SiH increase with the decrease in SiH2 and SiH3 concentration at 500°C, and vice versa at 600°C. Annealing results suggest thermally induced structural transformations of SiHn configurations. We propose a model of the transformations through the cleavage of adjacent Si-H bonds to form a Si-Si bond and a H2 molecule, as well as the reaction of a H2 molecule with a Si-Si bond.


Author(s):  
Shiro Fujishiro ◽  
Harold L. Gegel

Ordered-alpha titanium alloys having a DO19 type structure have good potential for high temperature (600°C) applications, due to the thermal stability of the ordered phase and the inherent resistance to recrystallization of these alloys. Five different Ti-Al-Ga alloys consisting of equal atomic percents of aluminum and gallium solute additions up to the stoichiometric composition, Ti3(Al, Ga), were used to study the growth kinetics of the ordered phase and the nature of its interface.The alloys were homogenized in the beta region in a vacuum of about 5×10-7 torr, furnace cooled; reheated in air to 50°C below the alpha transus for hot working. The alloys were subsequently acid cleaned, annealed in vacuo, and cold rolled to about. 050 inch prior to additional homogenization


Author(s):  
Yih-Cheng Shih ◽  
E. L. Wilkie

Tungsten silicides (WSix) have been successfully used as the gate materials in self-aligned GaAs metal-semiconductor-field- effect transistors (MESFET). Thermal stability of the WSix/GaAs Schottky contact is of major concern since the n+ implanted source/drain regions must be annealed at high temperatures (∼ 800°C). WSi0.6 was considered the best composition to achieve good device performance due to its low stress and excellent thermal stability of the WSix/GaAs interface. The film adhesion and the uniformity in barrier heights and ideality factors of the WSi0.6 films have been improved by depositing a thin layer of pure W as the first layer on GaAs prior to WSi0.6 deposition. Recently WSi0.1 has been used successfully as the gate material in 1x10 μm GaAs FET's on the GaAs substrates which were sputter-cleaned prior to deposition. These GaAs FET's exhibited uniform threshold voltages across a 51 mm wafer with good film adhesion after annealing at 800°C for 10 min.


1991 ◽  
Vol 1 (12) ◽  
pp. 1823-1836 ◽  
Author(s):  
M. Bessière ◽  
A. Quivy ◽  
S. Lefebvre ◽  
J. Devaud-Rzepski ◽  
Y. Calvayrac

1994 ◽  
Vol 4 (4) ◽  
pp. 653-657
Author(s):  
B. Bonzi ◽  
M. El Khomssi ◽  
H. Lanchon-Ducauquis

1998 ◽  
Vol 08 (PR2) ◽  
pp. Pr2-63-Pr2-66 ◽  
Author(s):  
R. Varga ◽  
P. Vojtaník ◽  
A. Lovas

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