scholarly journals Correlative Super-Resolution Optical and Atomic Force Microscopy Reveals Relationships Between Bacterial Cell Wall Architecture and Synthesis in Bacillus subtilis

ACS Nano ◽  
2021 ◽  
Author(s):  
Raveen K. G. Tank ◽  
Victoria A. Lund ◽  
Sandip Kumar ◽  
Robert D. Turner ◽  
Lucia Lafage ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Cell Wall ◽  
Bacillus Subtilis ◽  
Bacterial Cell ◽  
Super Resolution ◽  
Bacterial Cell Wall ◽  
Force Microscopy ◽  
Atomic Force ◽  
Cell Wall Architecture

An atomic force microscopy analysis of yeast mutants defective in cell wall architecture

Yeast ◽  
2010 ◽  
Vol 27 (8) ◽  
pp. 673-684 ◽  
Author(s):  
Etienne Dague ◽  
Rajaa Bitar ◽  
Hubert Ranchon ◽  
Fabien Durand ◽  
Hélène Martin Yken ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Cell Wall ◽  
Atomic Force Microscopy Analysis ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Analysis ◽  
Yeast Mutants ◽  
Cell Wall Architecture

Atomic force microscopy based analysis of cell-wall elasticity in macroalgae

2018 ◽  
pp. 335-347 ◽  
Author(s):  
Thomas Torode ◽  
Marina Linardic ◽  
J. Louis Kaplan ◽  
Siobhan A. Braybrook
Keyword(s):  
Atomic Force Microscopy ◽  
Cell Wall ◽  
Force Microscopy ◽  
Cell Wall Elasticity ◽  
Atomic Force

scholarly journals Recent Applications of Advanced Atomic Force Microscopy in Polymer Science: A Review

Polymers ◽  
2020 ◽  
Vol 12 (5) ◽  
pp. 1142 ◽  
Author(s):  
Phuong Nguyen-Tri ◽  
Payman Ghassemi ◽  
Pascal Carriere ◽  
Sonil Nanda ◽  
Aymen Amine Assadi ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Chemical Characterization ◽  
Super Resolution ◽  
Polymeric Materials ◽  
Polymer Materials ◽  
Polymer Science ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nanoscale Characterization

Atomic force microscopy (AFM) has been extensively used for the nanoscale characterization of polymeric materials. The coupling of AFM with infrared spectroscope (AFM-IR) provides another advantage to the chemical analyses and thus helps to shed light upon the study of polymers. This paper reviews some recent progress in the application of AFM and AFM-IR in polymer science. We describe the principle of AFM-IR and the recent improvements to enhance its resolution. We also discuss the latest progress in the use of AFM-IR as a super-resolution correlated scanned-probe infrared spectroscopy for the chemical characterization of polymer materials dealing with polymer composites, polymer blends, multilayers, and biopolymers. To highlight the advantages of AFM-IR, we report several results in studying the crystallization of both miscible and immiscible blends as well as polymer aging. Finally, we demonstrate how this novel technique can be used to determine phase separation, spherulitic structure, and crystallization mechanisms at nanoscales, which has never been achieved before. The review also discusses future trends in the use of AFM-IR in polymer materials, especially in polymer thin film investigation.

A high-speed atomic force microscopy with super resolution based on path planning scanning

2020 ◽  
Vol 213 ◽  
pp. 112991
Author(s):  
Yinan Wu ◽  
Yongchun Fang ◽  
Chao Wang ◽  
Cunhuan Liu ◽  
Zhi Fan
Keyword(s):  
Atomic Force Microscopy ◽  
Path Planning ◽  
High Speed ◽  
Super Resolution ◽  
Force Microscopy ◽  
Atomic Force
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