High-Speed Piezoresponse Force Microscopy and Machine Learning Approaches for Dynamic Domain Growth in Ferroelectric Materials

2020 ◽  
Vol 12 (8) ◽  
pp. 9944-9952
Author(s):  
Yue Liu ◽  
Bingxue Yu ◽  
Zhiwen Liu ◽  
David Beck ◽  
Kaiyang Zeng
Keyword(s):  
Machine Learning ◽  
High Speed ◽  
Piezoresponse Force Microscopy ◽  
Ferroelectric Materials ◽  
Domain Growth ◽  
Learning Approaches ◽  
Force Microscopy ◽  
Dynamic Domain

Switching spectroscopy piezoresponse force microscopy of ferroelectric materials

2006 ◽  
Vol 88 (6) ◽  
pp. 062908 ◽  
Author(s):  
Stephen Jesse ◽  
Arthur P. Baddorf ◽  
Sergei V. Kalinin
Keyword(s):  
Piezoresponse Force Microscopy ◽  
Ferroelectric Materials ◽  
Force Microscopy

scholarly journals Structural Health Monitoring and Damage Detection through Machine Learning approaches

2020 ◽  
Vol 220 ◽  
pp. 01096
Author(s):  
Priyanka Singh ◽  
Umaid Faraz Ahmad ◽  
Siddharth Yadav
Keyword(s):  
Machine Learning ◽  
Structural Health Monitoring ◽  
Damage Detection ◽  
Health Monitoring ◽  
High Speed ◽  
Primary Component ◽  
Primary Objective ◽  
Learning Approaches ◽  
Research Attention ◽  
Structural Health

Data-driven approaches are gaining popularity in structural health monitoring (SHM) due to recent technological advances in sensors, high-speed Internet and cloud computing. Since Machine learning (ML), particularly in SHM, was introduced in civil engineering, this modern and promising method has drawn significant research attention. SHM’s main goal is to develop different data processing methodologies and generate results related to the different levels of damage recognition process. SHM implements a technique for damage detection and classification, including data from a system collected under different structural states using a piezoelectric sensor network using guided waves, hierarchical non-linear primary component analysis and machine learning. The primary objective of this paper is to analyse the current SHM literature using evolving ML-based methods and to provide readers with an overview of various SHM applications. The technique and implementation of vibration-based, vision-based surveillance, along with some recent SHM developments are discussed.

High speed piezoresponse force microscopy: <1 frame per second nanoscale imaging

2008 ◽  
Vol 93 (7) ◽  
pp. 072905 ◽  
Author(s):  
Ramesh Nath ◽  
Ying-Hao Chu ◽  
Nicholas A. Polomoff ◽  
Ramamoorthy Ramesh ◽  
Bryan D. Huey
Keyword(s):  
High Speed ◽  
Piezoresponse Force Microscopy ◽  
Force Microscopy ◽  
Nanoscale Imaging

scholarly journals Piezoresponse in Ferroelectric Materials under Uniform Electric Field of Electrodes

Sensors ◽  
2021 ◽  
Vol 21 (11) ◽  
pp. 3707
Author(s):  
Artur Udalov ◽  
Denis Alikin ◽  
Andrei Kholkin
Keyword(s):  
Electric Field ◽  
Piezoelectric Materials ◽  
Piezoresponse Force Microscopy ◽  
Ferroelectric Materials ◽  
Piezoelectric Response ◽  
Uniform Electric Field ◽  
Anisotropic Solution ◽  
Force Microscopy ◽  
Quantitative Measurements ◽  
Wolfram Mathematica

The analytical solution for the displacements of an anisotropic piezoelectric material in the uniform electric field is presented for practical use in the “global excitation mode” of piezoresponse force microscopy. The solution is given in the Wolfram Mathematica interactive program code, allowing the derivation of the expression of the piezoresponse both in cases of the anisotropic and isotropic elastic properties. The piezoresponse’s angular dependencies are analyzed using model lithium niobate and barium titanate single crystals as examples. The validity of the isotropic approximation is verified in comparison to the fully anisotropic solution. The approach developed in the paper is important for the quantitative measurements of the piezoelectric response in nanomaterials as well as for the development of novel piezoelectric materials for the sensors/actuators applications.

Piezoresponse Force Microscopy

2009 ◽  
Vol 17 (6) ◽  
pp. 10-15 ◽  
Author(s):  
Roger Proksch ◽  
Sergei Kalinin
Keyword(s):  
Electromechanical Coupling ◽  
Cardiac Activity ◽  
Piezoresponse Force Microscopy ◽  
Ferroelectric Materials ◽  
Inorganic Materials ◽  
Active Materials ◽  
Force Microscopy ◽  
Nanoscale Imaging ◽  
Imaging Sensors ◽  
Mechanical Phenomena

Coupling between electrical and mechanical phenomena is an important feature of functional inorganic materials and biological systems alike. The applications of electromechanically active materials include sonar, ultrasonic and medical imaging, sensors, actuators, and energy-harvesting technologies, as well as non-volatile computer memories. Electromechanical coupling in electromotor proteins and cellular membranes is the universal basis for biological functionalities from hearing to cardiac activity. The future will undoubtedly see the emergence of broad arrays of piezoelectric, biological, and molecular-based electromechanical systems to allow mankind the capability not only to “think” but also “act” on the nanoscale. The need for probing electromechanical functionalities has led to the development of Piezoresponse Force Microscopy (PFM) as a tool for local nanoscale imaging (Figures 1 and 2), spectroscopy, and manipulation of piezoelectric and ferroelectric materials.

Influence of a Poling Procedure on Dynamics of Ferroelectric Domains in Thin PbZr0.3Ti0.7O3 Film at Low Temperatures

2015 ◽  
Vol 245 ◽  
pp. 217-222 ◽  
Author(s):  
Natalia V. Andreeva ◽  
Alexey V. Filimonov ◽  
Alexander F. Vakulenko ◽  
Sergey B. Vakhrushev
Keyword(s):  
Low Temperatures ◽  
Domain Wall Motion ◽  
Domain Size ◽  
Piezoresponse Force Microscopy ◽  
Domain Growth ◽  
Dc Voltage ◽  
Force Microscopy ◽  
Ferroelectric Domains ◽  
Out Of Plane ◽  
Domain Dynamics

An experimental study of low temperature domain dynamics could provide information on a mechanism of domain wall motion at low temperatures in thin ferroelectric films. For this purpose we use a piezoresponse force microscopy (PFM) technique and investigate the 1800 ferroelectric domains growth in the temperature range 5 K – 295 K. Domains were created by applying a dc voltage pulses between an atomic force microscopy (AFM) tip and a bottom electrode of a thin epitaxial PbZr0.3Ti0.7O3 film. Two different types of tips were used, a semiconducting tip with dopant conductivity and a tip with metallic coating to clarify an influence of poling procedure on the domain dynamics. Created domains were then visualized and their in-plane sizes were measured with out-of-plane PFM. Dependences of lateral domain size on the duration and amplitude of dc voltage pulse were obtained. Received experimental dependences were then fitted with logarithmic function with good accuracy. This circumstance indicates on the thermally activated mechanism of domain growth and formation. Temperature dynamics of the 1800 ferroelectric domains growth does not depend on the AFM tip used in a poling procedure what allows us to conclude that the voltage transfer to the ferroelectric film does not significantly depend on the tip-film local contact properties.

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