Chemical Imaging of Buried Interfaces in Organic–Inorganic Devices Using Focused Ion Beam-Time-of-Flight-Secondary-Ion Mass Spectrometry

Mariavitalia Tiddia; Ichiro Mihara; Martin P. Seah; Gustavo Ferraz Trindade; Felix Kollmer; Clive J. Roberts; Richard Hague; Guido Mula; Ian S. Gilmore; Rasmus Havelund

doi:10.1021/acsami.8b15091

Chemical Imaging of Buried Interfaces in Organic–Inorganic Devices Using Focused Ion Beam-Time-of-Flight-Secondary-Ion Mass Spectrometry

ACS Applied Materials & Interfaces ◽

10.1021/acsami.8b15091 ◽

2019 ◽

Vol 11 (4) ◽

pp. 4500-4506 ◽

Cited By ~ 2

Author(s):

Mariavitalia Tiddia ◽

Ichiro Mihara ◽

Martin P. Seah ◽

Gustavo Ferraz Trindade ◽

Felix Kollmer ◽

...

Keyword(s):

Mass Spectrometry ◽

Focused Ion Beam ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Time Of Flight ◽

Chemical Imaging ◽

Buried Interfaces ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Comparison of the Spectra of LiCoO2, CoO, and Co3O4 by Time-of-Flight Secondary Ion Mass Spectrometry with Focused Ion Beam (FIB-TOF-SIMS)

Journal of the Vacuum Society of Japan ◽

10.3131/jvsj2.56.122 ◽

2013 ◽

Vol 56 (4) ◽

pp. 122-124 ◽

Cited By ~ 2

Author(s):

Miwa OHNISHI ◽

Osamu MATSUOKA ◽

Hidenobu NOGI ◽

Tetsuo SAKAMOTO

Keyword(s):

Mass Spectrometry ◽

Focused Ion Beam ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Time Of Flight ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Secondary Ion

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A New Focused Ion Beam Optical System for a Time-of-flight-Secondary Ion Mass Spectrometry Instrument

Rapid Communications in Mass Spectrometry ◽

10.1002/(sici)1097-0231(19970131)11:2<175::aid-rcm725>3.0.co;2-k ◽

1997 ◽

Vol 11 (2) ◽

pp. 175-178 ◽

Cited By ~ 4

Author(s):

H. Shichi ◽

S. Osabe ◽

K. Kanehori

Keyword(s):

Mass Spectrometry ◽

Optical System ◽

Focused Ion Beam ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Time Of Flight ◽

Mass Spectrometry Instrument ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Practical Aspects of Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry Analysis Enhanced by Fluorine Gas Coinjection

Chemistry of Materials ◽

10.1021/acs.chemmater.1c00052 ◽

2021 ◽

Author(s):

Krzysztof Wieczerzak ◽

Agnieszka Priebe ◽

Ivo Utke ◽

Johann Michler

Keyword(s):

Mass Spectrometry ◽

Focused Ion Beam ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Time Of Flight ◽

Mass Spectrometry Analysis ◽

Spectrometry Analysis ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Improvement of sensitivity using principal component analysis by dual focused ion beam time-of-flight secondary ion mass spectrometry

Applied Surface Science ◽

10.1016/j.apsusc.2008.05.078 ◽

2008 ◽

Vol 255 (4) ◽

pp. 1052-1054 ◽

Cited By ~ 2

Author(s):

Yoshihiro Morita ◽

Masanori Owari

Keyword(s):

Mass Spectrometry ◽

Principal Component Analysis ◽

Focused Ion Beam ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Time Of Flight ◽

Principal Component ◽

Component Analysis ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Three-Dimensional Image of Cleavage Bodies in Nuclei Is Configured Using Gas Cluster Ion Beam with Time-of-Flight Secondary Ion Mass Spectrometry

Scientific Reports ◽

10.1038/srep10000 ◽

2015 ◽

Vol 5 (1) ◽

Cited By ~ 4

Author(s):

Noritaka Masaki ◽

Itsuko Ishizaki ◽

Takahiro Hayasaka ◽

Gregory L. Fisher ◽

Noriaki Sanada ◽

...

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Three Dimensional ◽

Time Of Flight ◽

Dimensional Image ◽

Ion Mass Spectrometry ◽

Cluster Ion ◽

Gas Cluster Ion Beam ◽

Secondary Ion

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High-Resolution Epifluorescence and Time-of-Flight Secondary Ion Mass Spectrometry Chemical Imaging Comparisons of Single DNA Microarray Spots

Analytical Chemistry ◽

10.1021/ac3019334 ◽

2012 ◽

Vol 84 (24) ◽

pp. 10628-10636 ◽

Cited By ~ 17

Author(s):

Archana N. Rao ◽

Nicolas Vandencasteele ◽

Lara J. Gamble ◽

David W. Grainger

Keyword(s):

Mass Spectrometry ◽

High Resolution ◽

Dna Microarray ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Chemical Imaging ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Chemical Imaging of Fingerprint on RMB Banknotes Using Time-of-Flight Secondary Ion Mass Spectrometry

Chinese Journal of Analytical Chemistry ◽

10.1016/s1872-2040(20)60059-7 ◽

2020 ◽

Vol 48 (11) ◽

pp. 1511-1518

Author(s):

Wen-Jie LI ◽

Ling-Hui SUN ◽

Wei YOU ◽

Li-Xue WANG ◽

Ya-Bin ZHAO ◽

...

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Chemical Imaging ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Inter-diffusion between PMMA and PVDF during lamination studied by time-of-flight secondary ion mass spectrometry chemical imaging

Surface and Interface Analysis ◽

10.1002/sia.1226 ◽

2002 ◽

Vol 33 (5) ◽

pp. 455-458 ◽

Cited By ~ 7

Author(s):

Jiyun Feng ◽

Lin Li ◽

Chi-Ming Chan ◽

Lu-Tao Weng

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Chemical Imaging ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Chemical Imaging of Pharmaceuticals by Time-of-flight Secondary Ion Mass Spectrometry

ChemInform ◽

10.1002/chin.200410300 ◽

2004 ◽

Vol 35 (10) ◽

Author(s):

S. Y. Luk ◽

N. Patel ◽

M. C. Davies

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Chemical Imaging ◽

Ion Mass Spectrometry ◽

Secondary Ion

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A C60Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry: Its Development and Secondary Ion Yield Characteristics

Analytical Chemistry ◽

10.1021/ac026338o ◽

2003 ◽

Vol 75 (7) ◽

pp. 1754-1764 ◽

Cited By ~ 420

Author(s):

Daniel Weibel ◽

Steve Wong ◽

Nicholas Lockyer ◽

Paul Blenkinsopp ◽

Rowland Hill ◽

...

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Time Of Flight ◽

Beam System ◽

Ion Mass Spectrometry ◽

Secondary Ion

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