scholarly journals Locally Resolved Electron Emission Area and Unified View of Field Emission from Ultrananocrystalline Diamond Films

2017 ◽  
Vol 9 (38) ◽  
pp. 33229-33237 ◽  
Author(s):  
Oksana Chubenko ◽  
Stanislav S. Baturin ◽  
Kiran K. Kovi ◽  
Anirudha V. Sumant ◽  
Sergey V. Baryshev
2008 ◽  
Vol 103 (4) ◽  
pp. 043720 ◽  
Author(s):  
P. T. Joseph ◽  
N. H. Tai ◽  
Chi-Young Lee ◽  
H. Niu ◽  
W. F. Pong ◽  
...  

2012 ◽  
Vol 112 (10) ◽  
pp. 103711 ◽  
Author(s):  
Huang-Chin Chen ◽  
Kamatchi Jothiramalingam Sankaran ◽  
Shen-Chuan Lo ◽  
Li-Jiaun Lin ◽  
Nyan-Hwa Tai ◽  
...  

2005 ◽  
Vol 475-479 ◽  
pp. 3587-3590
Author(s):  
K.J. Liao ◽  
W.L. Wang ◽  
Y.T. Wang ◽  
J.W. Lu ◽  
X.L. Sun

The field electron emission from carbon nanotube films on polycrystalline diamond films was investigated. The carbon nanotubes and diamond films on Si substrates were prepared by a conventional hot filament chemical vapour deposition. The films obtained were characterized by scanning electron microscopy and Raman spectroscopy. The field emission properties of the samples were measured in an ion-pumped vacuum chamber at a pressure of 10-6 Pa.. The experimental results showed that the field emission behaviours of carbon nanotubes/diomond films structure have greatly been improved as compared with carbon nanotubes and diamond films, respectively. A turn-on field of 1.0 V/µm and a maximum current of 500 µA at 1.5 V/µm were observed, which were lower than those of carbon nanotubes and polycrystalline diamond films, respectively. This improvement was attributed to the tip shape of sample surface, which provided an additional local increase in electric field at the tube ends.


2000 ◽  
Vol 621 ◽  
Author(s):  
F.A.M. Köck ◽  
J.M. Garguilo ◽  
B. Brown ◽  
R.J. Nemanich

ABSTRACTImaging of field emission and photoemission from diamond surfaces is accomplished with a high resolution photo-electron emission microscope (PEEM). Measurements obtained as a function of sample temperature up to 1000°C display thermionic field emission images (TFEEM). The system can also record the emission current versus applied voltage. N-doped diamond films have been produced by MPCVD with a N/C gas phase ratio of 48. The surfaces display uniform emission in PEEM at all temperatures. No FEEM images are detectable below 500°C. At ∼680°C the T-FEEM and PEEM images are nearly identical in intensity and uniformity. This is to be contrasted with other carbon based cold cathodes in which the emission is observed from only a low density of highly emitting sites. The I/V measurements obtained from the N-doped films in the T-FEEM configuration show a component that depends linearly on voltage at low fields. At higher fields, an approximately exponential dependence is observed. At low temperatures employed (<700°C), the results indicate a thermionic component to the emitted current.


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