Hydrogen Barriers Based on Chemical Trapping Using Chemically Modulated Al2O3 Grown by Atomic Layer Deposition for InGaZnO Thin-Film Transistors
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2014 ◽
Vol 61
(1)
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pp. 73-78
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2018 ◽
Vol 36
(6)
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pp. 060801
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2019 ◽
Vol 7
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pp. 453-461
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