Atomic Layer Deposition of Silicon Dioxide Using Aminosilanes Di-sec-butylaminosilane and Bis(tert-butylamino)silane with Ozone

2016 ◽  
Vol 120 (20) ◽  
pp. 10927-10935 ◽  
Author(s):  
Luis Fabián Peña ◽  
Charith E. Nanayakkara ◽  
Anupama Mallikarjunan ◽  
Haripin Chandra ◽  
Manchao Xiao ◽  
...  
2010 ◽  
Vol 107 (6) ◽  
pp. 064314 ◽  
Author(s):  
D. Hiller ◽  
R. Zierold ◽  
J. Bachmann ◽  
M. Alexe ◽  
Y. Yang ◽  
...  

2009 ◽  
Vol 19 (38) ◽  
pp. 7050 ◽  
Author(s):  
Jongmin Lee ◽  
Shadyar Farhangfar ◽  
Renbin Yang ◽  
Roland Scholz ◽  
Marin Alexe ◽  
...  

Coatings ◽  
2018 ◽  
Vol 8 (11) ◽  
pp. 403 ◽  
Author(s):  
Luis Fernández-Menéndez ◽  
Ana González ◽  
Víctor Vega ◽  
Víctor de la Prida

In this work, the entire manufacturing process of electrostatic supercapacitors using the atomic layer deposition (ALD) technique combined with the employment of nanoporous anodic alumina templates as starting substrates is reported. The structure of a usual electrostatic capacitor, which comprises a top conductor electrode/the insulating dielectric layer/and bottom conductor electrode (C/D/C), has been reduced to nanoscale size by depositing layer by layer the required materials over patterned nanoporous anodic alumina membranes (NAAMs) by employing the ALD technique. A thin layer of aluminum-doped zinc oxide, with 3 nm in thickness, is used as both the top and bottom electrodes’ material. Two dielectric materials were tested; on the one hand, a triple-layer made by a successive combination of 3 nm each layers of silicon dioxide/titanium dioxide/silicon dioxide and on the other hand, a simple layer of alumina, both with 9 nm in total thickness. The electrical properties of these capacitors are studied, such as the impedance and capacitance dependences on the AC frequency regime (up to 10 MHz) or capacitance (180 nF/cm2) on the DC regime. High breakdown voltage values of 60 V along with low leakage currents (0.4 μA/cm2) are also measured from DC charge/discharge RC circuits to determine the main features of the capacitors behavior integrated in a real circuit.


1995 ◽  
Vol 187 ◽  
pp. 66-69 ◽  
Author(s):  
S. Morishita ◽  
W. Gasser ◽  
K. Usami ◽  
M. Matsumura

2016 ◽  
Vol 4 (18) ◽  
pp. 4034-4039 ◽  
Author(s):  
Ling Ju ◽  
Nicholas C. Strandwitz

A suite of four volatile aminosilanes, cyclic azasilanes, was used to deposit silicon dioxide (SiO2) films by atomic layer deposition (ALD) over the temperature range 100–300 °C by reaction with O3.


2018 ◽  
Vol 660 ◽  
pp. 572-577 ◽  
Author(s):  
Donghyuk Shin ◽  
Heungseop Song ◽  
Minhyeong Lee ◽  
Heungsoo Park ◽  
Dae-Hong Ko

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