Near-Surface Composition, Structure, and Energetics of TiO2 Thin Films: Characterization of Stress-Induced Defect States in Oxides Prepared via Chemical Vapor Deposition versus Solution Deposition from Sol–Gel Precursors
Keyword(s):
Sol Gel
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The Ferroelectric and Electrical Properties of CaBi4Ti4O15 Thin Films Prepared by Sol-Gel Technology
2011 ◽
Vol 239-242
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pp. 891-894
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1999 ◽
Vol 8
(10)
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pp. 1863-1874
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2014 ◽
Vol 5
(7)
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pp. 367-371
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