First-Principles Calculations of Silicon Interstitial Defects at the Amorphous-SiO2/Si Interface
Keyword(s):
Keyword(s):
2000 ◽
Vol 3
(1-2)
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pp. 143-148
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Electronic Structure and X-ray Absorption Spectra of Rutile TiO2 Using First-Principles Calculations
2014 ◽
Vol 52
(12)
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pp. 1025-1029
Keyword(s):
X Ray
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2019 ◽
2010 ◽
Vol 2010
(1)
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pp. 97-103
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1993 ◽
Vol 5
(30)
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pp. 5343-5352
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