Chain-Length Dependence of Optical Properties for an Alkanethiol Monolayer on an Ultrathin Gold Film Revealed via Reflected Light Microscopy

2021 ◽  
Author(s):  
Yoshiaki Hattori ◽  
Hayato Takahashi ◽  
Naoki Ikematsu ◽  
Masatoshi Kitamura
Keyword(s):  
Optical Properties ◽  
Light Microscopy ◽  
Chain Length ◽  
Gold Film ◽  
Length Dependence ◽  
Reflected Light ◽  
Ultrathin Gold Film

Strong main-chain length-dependence for the β-phase formation of oligofluorenes

2015 ◽  
Vol 6 (28) ◽  
pp. 5103-5109 ◽  
Author(s):  
Tomohiro Shiraki ◽  
Shoichiro Shindome ◽  
Fumiyuki Toshimitsu ◽  
Tsuyohiko Fujigaya ◽  
Naotoshi Nakashima
Keyword(s):  
Optical Properties ◽  
Chain Length ◽  
Phase Formation ◽  
Main Chain ◽  
Characteristic Structure ◽  
Length Dependence ◽  
Β Phase ◽  
Wide Range

Wide range chain length-oligofluorenes (9–27 mers) have been synthesized and their optical properties are examined. Interestingly, clear chain length dependence appeared in the absorption and fluorescence functions due to β-phase formation that is a characteristic structure of fluorene materials.

Ultrathin gold film modified optical properties of excitons in monolayer MoS2

2017 ◽  
Vol 19 (40) ◽  
pp. 27259-27265 ◽  
Author(s):  
Guang Yi Jia ◽  
Qiang Zhang ◽  
Zhen Xian Huang ◽  
Shu Bin Huang ◽  
Jing Xu
Keyword(s):  
Optical Properties ◽  
Gold Film ◽  
Incident Angle ◽  
Optical Scattering ◽  
Monolayer Mos2 ◽  
Excitonic Absorption ◽  
Ultrathin Gold Film

The incident angle for maximum C excitonic absorption deviates from the SPR angle due to the ultrathin-gold-film-induced optical scattering.

Visualization of a hexagonal born nitride monolayer on an ultra-thin gold film via reflected light microscopy

2021 ◽  
Author(s):  
Yoshiaki Hattori ◽  
Takashi Taniguchi ◽  
Kenji Watanabe ◽  
Masatoshi Kitamura
Keyword(s):  
Light Microscopy ◽  
Gold Film ◽  
Thin Gold Film ◽  
Reflected Light

Tandem scanning reflected light microscopy: How it works and applications

1986 ◽  
Vol 44 ◽  
pp. 84-87
Author(s):  
Alan Boyde ◽  
Milan Hadravský ◽  
Mojmír Petran ◽  
Timothy F. Watson ◽  
Sheila J. Jones ◽  
...  
Keyword(s):  
Light Microscopy ◽  
Focal Plane ◽  
Central Symmetry ◽  
Single Line ◽  
Scanning Microscope ◽  
Reflected Light ◽  
Illuminating Light ◽  
Illuminating Beam

The principles of tandem scanning reflected light microscopy and the design of recent instruments are fully described elsewhere and here only briefly. The illuminating light is intercepted by a rotating aperture disc which lies in the intermediate focal plane of a standard LM objective. This device provides an array of separate scanning beams which light up corresponding patches in the plane of focus more intensely than out of focus layers. Reflected light from these patches is imaged on to a matching array of apertures on the opposite side of the same aperture disc and which are scanning in the focal plane of the eyepiece. An arrangement of mirrors converts the central symmetry of the disc into congruency, so that the array of apertures which chop the illuminating beam is identical with the array on the observation side. Thus both illumination and “detection” are scanned in tandem, giving rise to the name Tandem Scanning Microscope (TSM). The apertures are arranged on Archimedean spirals: each opposed pair scans a single line in the image.

Defects of Planarity of Carbon Films Supported on Electron Microscope Grids Revealed by Reflected Light Microscopy

1994 ◽  
Vol 112 (3) ◽  
pp. 252-258 ◽  
Author(s):  
Marc Schmutz ◽  
Jacques Lang ◽  
Sabine Graff ◽  
Alain Brisson
Keyword(s):  
Electron Microscope ◽  
Light Microscopy ◽  
Carbon Films ◽  
Reflected Light
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