Intra- and Intercellular Silver Nanoparticle Translocation and Transformation in Oyster Gill Filaments: Coupling Nanoscale Secondary Ion Mass Spectrometry and Dual Stable Isotope Tracing Study

2020 ◽  
Vol 55 (1) ◽  
pp. 433-446
Author(s):  
Zishuang Shao ◽  
Paul Guagliardo ◽  
Haibo Jiang ◽  
Wen-Xiong Wang
Keyword(s):  
Mass Spectrometry ◽  
Stable Isotope ◽  
Silver Nanoparticle ◽  
Secondary Ion Mass Spectrometry ◽  
Isotope Tracing ◽  
Ion Mass Spectrometry ◽  
Gill Filaments ◽  
Secondary Ion

scholarly journals Stable Isotope Probing of RNA Combining Phylogenetic Microarrays and High Resolution Secondary Ion Mass Spectrometry to Link Composition and Function in Microbial Systems

2010 ◽  
Vol 16 (S2) ◽  
pp. 426-427
Author(s):  
X Mayali ◽  
PK Weber ◽  
EL Brodie ◽  
S Mabery ◽  
PD Hoeprich ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
High Resolution ◽  
Stable Isotope ◽  
Secondary Ion Mass Spectrometry ◽  
Stable Isotope Probing ◽  
Ion Mass Spectrometry ◽  
And Function ◽  
Microbial Systems ◽  
Secondary Ion

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

scholarly journals Tracing Cationic Nutrients from Xylem into Stem Tissue of French Bean by Stable Isotope Tracers and Cryo-Secondary Ion Mass Spectrometry

2009 ◽  
Vol 152 (2) ◽  
pp. 1030-1043 ◽  
Author(s):  
Ralf Metzner ◽  
Heike Ursula Schneider ◽  
Uwe Breuer ◽  
Michael Robert Thorpe ◽  
Ulrich Schurr ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Stable Isotope ◽  
Secondary Ion Mass Spectrometry ◽  
French Bean ◽  
Stem Tissue ◽  
Stable Isotope Tracers ◽  
Isotope Tracers ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

1990 ◽  
Vol 48 (2) ◽  
pp. 308-309
Author(s):  
Bruno Schueler ◽  
Robert W. Odom
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Structural Information ◽  
Time Of Flight ◽  
Biological Tissues ◽  
Polymer Surfaces ◽  
Tof Sims ◽  
Secondary Ions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.

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