scholarly journals Complementary Imaging of Silver Nanoparticle Interactions with Green Algae: Dark-Field Microscopy, Electron Microscopy, and Nanoscale Secondary Ion Mass Spectrometry

ACS Nano ◽  
2017 ◽  
Vol 11 (11) ◽  
pp. 10894-10902 ◽  
Author(s):  
Ryo Sekine ◽  
Katie L. Moore ◽  
Marianne Matzke ◽  
Pascal Vallotton ◽  
Haibo Jiang ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Mass Spectrometry ◽  
Green Algae ◽  
Silver Nanoparticle ◽  
Secondary Ion Mass Spectrometry ◽  
Dark Field ◽  
Nanoparticle Interactions ◽  
Dark Field Microscopy ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Enhanced Diffusion and Formation of Defects During Thermal Oxidation

1980 ◽  
Vol 2 ◽  
Author(s):  
J. Narayan ◽  
J. Fletcher ◽  
B. R. Appleton ◽  
W. H. Christie
Keyword(s):  
Electron Microscopy ◽  
Mass Spectrometry ◽  
Thermal Oxidation ◽  
Secondary Ion Mass Spectrometry ◽  
Rutherford Backscattering ◽  
Enhanced Diffusion ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

ABSTRACTEnhanced diffusion of dopants and the formation of defects during thermal oxidation of silicon has been investigated using electron microscopy, Rutherford backscattering, and secondary ion mass spectrometry techniques. Enhanced diffusion of boron was clearly demonstrated in laser annealed specimens in which secondary defects were not present. In the presence of secondary defects, such as precipitates, enhanced diffusion of boron was not observed. The absence of enhanced diffusion during thermal oxidation was also observed for arsenic in silicon. The mechanisms associated with thermal–oxidation enhanced diffusion are discussed briefly.

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